Nanometrics Files New Complaint Against Nova Measuring Instruments for Patent Infringement.MILPITAS, Calif. -- Nanometrics Incorporated (Nasdaq:NANO), a leading supplier of advanced integrated and standalone stand·a·lone adj. Self-contained and usually independently operating: a standalone computer terminal. metrology equipment to the semiconductor industry, today announced it has filed a complaint in the United States District Court for the Northern District of California The United States District Court for the Northern District of California is the Federal district court whose jurisdiction comprises following counties: Alameda, Contra Costa, Del Norte, Humboldt, Lake, Marin, Mendocino, Monterey, Napa, San Benito, San Francisco, San Mateo, Santa against Nova Measuring Instruments Ltd. for patent infringement patent infringement n. the manufacture and/or use of an invention or improvement for which someone else owns a patent issued by the government, without obtaining permission of the owner of the patent by contract, license or waiver. . The patents at issue relate to Nanometrics' optical critical dimension technology, commonly referred to as scatterometry. "Nanometrics continues to expand its intellectual property portfolio, both internally and through acquisition," said John Heaton John Heaton may refer to:
The complaint filed today relates to U.S. Patent Numbers 5,867,276, entitled "Method for Broad Wavelength Scatterometry," and 7,115,858 B1, entitled "Apparatus and Method for the Measurement of Diffracting Structures." This filing follows the March 30, 2006 announcement of the complaint filed against Nova Measuring Instruments Ltd. in the United States District Court for the Northern District of California for infringing Nanometrics' U.S. Patent Number Re. 34,783. The patent, "Method for Determining Absolute Reflectance re·flec·tance n. The ratio of the total amount of radiation, as of light, reflected by a surface to the total amount of radiation incident on the surface. Noun 1. of a Material in the Ultraviolet Range," relates to Nanometrics' ultraviolet reflectometry and optical critical dimension tools. About Nanometrics: Nanometrics is a leader in the design, manufacture and marketing of high-performance process control metrology systems used in semiconductor manufacturing. Nanometrics metrology systems measure various thin film properties, critical dimensions, overlay control The introduction to this article provides insufficient context for those unfamiliar with the subject matter. Please help [ improve the introduction] to meet Wikipedia's layout standards. You can discuss the issue on the talk page. and optical, electrical and material properties, including the structural composition of silicon and compound semiconductor devices, during various steps of the manufacturing process. These systems enable semiconductor manufacturers to improve yields, increase productivity and lower their manufacturing costs. The Company maintains its headquarters in Milpitas, California Milpitas (IPA pronunciation: mɪlpitʌs; inhabitants are called 'Milpitans') is a city in Santa Clara County, California. It is located with San Jose to its south and Fremont to its north, at the eastern end of Highway 237 and generally between Interstate freeways 680 and , with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Market under the symbol NANO. Nanometrics' website is http://www.nanometrics.com. |
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