NOVEL COMBINATORIAL METHODS FOR INORGANIC THIN FILMS.Over the past decade, combinatorial chemistry, which involves high throughput synthesis and analysis of a multivariable "library" containing a large number of miniaturized samples, has revolutionized the drug discovery process in the pharmaceuticals industry. Recently, materials scientists have been applying combinatorial principles to the discovery and optimization of inorganic thin films for electronic, photonic, and magnetic devices; this requires unique tools for library fabrication fabrication (fab´rikā´sh n the construction or making of a restoration. and characterization. Researchers at NIST (National Institute of Standards & Technology, Washington, DC, www.nist.gov) The standards-defining agency of the U.S. government, formerly the National Bureau of Standards. It is one of three agencies that fall under the Technology Administration (www.technology. have developed a novel dual-beam, dual-target pulsed laser deposition process for the fabrication of compositionally-graded thin film libraries. The deposition system has high-speed, in situ In place. When something is "in situ," it is in its original location. diagnostics, which permit real-time fine-tuning of the two laser plumes to optimize the deposition parameters. This technique is applicable to a wide range of complex oxides, metals, and metal/oxide composites. To date, libraries of [BaTiO.sub.3][SrTiO.sub.3], a material of interest for wireless co mmunication devices, have been deposited on silicon substrates. Film thickness has been mapped at a spatial resolution (Data West Research Agency definition: see GIS glossary.) A measure of the accuracy or detail of a graphic display, expressed as dots per inch, pixels per line, lines per millimeter, etc. It is a measure of how fine an image is, usually expressed in dots per inch (dpi). of 0.3 mm using a spectroscopic spec·tro·scope n. An instrument for producing and observing spectra. spec tro·scop reflectometry apparatus designed by NIST researchers. Composition and dielectric properties of the libraries are being characterized by high throughput measurement techniques.
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