NIST successfully transfers x-ray microcalorimeter technology from boulder to gaithersburg. (News Briefs).

The microcalorimeter energy dispersive x-ray spectrometer developed by NIST staff, has been successfully implemented on an analytical scanning electron microscope in Gaithersburg. The system improves the spectral resolution by one to two orders of magnitude compared to the semiconductor silicon energy dispersive x-ray spectrometer which forms the existing industry standard.

Such improved resolution combined with energy dispersive operation makes possible direct spectral separation of most overlapping peaks often encountered with silicon energy dispersive x-ray spectrometery in complex multi-element systems. The improved resolution of the microcalorimeter energy dispersive x-ray spectrometer also increases the peak-to-background ratio, which translates into more sensitive detection. Peak shape and shift can be studied to reveal chemical state information. The microcalorimeter energy dispersive x-ray spectrometer will be used initially by NIST scientists for a program of basic x-ray spectrometry to establish better values of weights of lines of complex L- and M-family x rays in the 200 eV 3 keV range. This improved spectral database is vital for the next stage in developing a systematic approach to low energy x-ray microanalysis.

CONTACT: Kent D. Irwin, [phone]; [e-mail] or Dale Newbury, [phone]; [e-mail].