Printer Friendly
The Free Library
18,914,692 articles and books
Member login
User name  
Password 
 
Join us Forgot password?

NIST structural database used for phase identification in electron diffraction instruments. (News Briefs).


Researchers use crystallographic crys·tal·log·ra·phy  
n.
The science of crystal structure and phenomena.



crystal·log
 information on a daily basis to visualize, explain, and predict the behavior of chemicals and materials. The NIST (National Institute of Standards & Technology, Washington, DC, www.nist.gov) The standards-defining agency of the U.S. government, formerly the National Bureau of Standards. It is one of three agencies that fall under the Technology Administration (www.technology.  Structural Database (NSD NSD

Nairobi sheep disease.
) contains crystallographic and atomic positional information for metallic crystalline substances, including alloys, intermetallics, and minerals. Under an agreement recently signed with an instrument manufacturer, the NSD has been incorporated into an electron diffraction Electron diffraction

The phenomenon associated with interference processes that occur when electrons are scattered by atoms to form diffraction patterns.
 instrument for automatic phase characterization and identification.

The new electron diffraction software searches the NSD by elemental composition, retrieves the full structural crystallographic information, and uses this to generate a calculated or simulated electron diffraction pattern. Unknown phases can then be identified automatically by matching the calculated patterns with the observed patterns generated using the electron backscatter diffraction Electron backscatter diffraction (EBSD), also known as backscatter Kikuchi diffraction (BKD) is a microstructural-crystallographic technique used to elucidate the crystallographic texture or preferred orientation of any crystalline or polycrystalline materials.  technique, an increasingly popular scanning electron microscope-based technique used for the analysis of samples in materials science, geology, microelectronics and related research fields.

CONTACT: Vicky Lynn Karen, (301) 975-6255; vicky.karen@nist.gov.
COPYRIGHT 2002 National Institute of Standards and Technology
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2002, Gale Group. All rights reserved. Gale Group is a Thomson Corporation Company.

 Reader Opinion

Title:

Comment:



 

Article Details
Printer friendly Cite/link Email Feedback
Title Annotation:National Institute of Standards and Technology
Publication:Journal of Research of the National Institute of Standards and Technology
Article Type:Brief Article
Geographic Code:1USA
Date:Mar 1, 2002
Words:148
Previous Article:NIST immersive visualization environment available. (News Briefs).(National Institute of Standards and Technology)(Brief Article)
Next Article:NIST researcher's findings influence industry acceptance of physical model for breakdown. (News Briefs).(National Institute of Standards and...
Topics:



Related Articles
Counting electrons for a new standard. (new standard for measuring capacitance) (Brief Article)
Counting millions of electrons, one by one. (National Institute of Standards and Technology's electron pump counts electrons with great...
NIST'S SOFTWARE USABILITY PROGRAM GAINING INDUSTRY ATTENTION.(Brief Article)
VERY LOW-NOISE SINGLE ELECTRON TUNNELING TRANSISTORS.
Electron diffraction using transmission electron microscopy.
Crystallographic phase analysis of submicrometer particles by electron backscatter diffraction. (New Briefs).(Brief Article)
Leading NIST publication cited. (General Developments).(Brief Article)
One-dimensional "pencil" disorder discovered for a class of intermetallic compounds. (General Developments).
NCNR'S user-friendly rietveld software has wide impact on structure analysis.(General Developments)
A backscatter suppressed electron detector for the measurement of "a".

Terms of use | Copyright © 2010 Farlex, Inc. | Feedback | For webmasters | Submit articles