NIST reduces uncertainties in fast-pulse calibration service. (News Briefs).The application of new test instruments, a new test procedure, and an improved uncertainty analysis has resulted in a significant reduction in the reported uncertainty for transition duration (i.e., rise time and fall times) provided by NIST (National Institute of Standards & Technology, Washington, DC, www.nist.gov) The standards-defining agency of the U.S. government, formerly the National Bureau of Standards. It is one of three agencies that fall under the Technology Administration (www.technology. Special Test 65200S, "Fast Repetitive Pulse Transition Parameters." The uncertainties have been reduced from -2.2 ps/+ 4.4 ps to [+ or -] 1.5 ps. In addition, the parameters of overshoot o·ver·shoot n. A change from steady state in response to a sudden change in some factor, as in electric potential or polarity when a cell or tissue is stimulated. and undershoot un·der·shoot n. A temporary decrease below the final steady-state value that may occur immediately following the removal of an influence that had been raising that value. have been added to the list of parameters provided by the 65200S. The addition of these parameters was possible be cause of the new uncertainty analysis. The 65200S calibration service is used by manufacturers of high-speed samplers, military calibration laboratories, and aerospace and computer industries to calibrate To adjust or bring into balance. Scanners, CRTs and similar peripherals may require periodic adjustment. Unlike digital devices, the electronic components within these analog devices may change from their original specification. See color calibration and tweak. the output of high-speed pulse generators Pulse generator An electronic circuit capable of producing a waveform that rises abruptly, maintains a relatively flat top for an extremely short interval, and then rapidly falls to zero. and the step response of high-speed samplers. The reduction in transition duration uncertainty is significant because of the increase in speed of commercial samplers and in the circuits that they are intended to test. With these improvements, there are no other national metrology laboratories that surpass the measurement capability of NIST in high-speed pulse parameters. CONTACT: Gerald FitzPatrick, (301) 975-8922; gerald.fitzpatrick@nist.gov. |
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