Mitsubishi's Information Technology R&D Center selects Viewlogic's Sunrise TestGen tool suite.

MARLBORO, Mass.--(BUSINESS WIRE)--May 8, 1997-- Mitsubishi's Information Technology R&D Center and Viewlogic Systems today announced that the Sunrise TestGen tool suite has been selected for use on ASIC circuits designed at their Ofuna R&D center.

According to Noriyuki Minegishi, Senior Engineer, "Our charter is the development of advanced Futurebus+ chips of the highest quality and reliability to meet the requirements of our systems and the needs of our customers. For that reason we have integrated design for test (DFT) and automatic test generation (ATG) tools within our design flows." Mr. Minegishi added, "After careful consideration and extensive testing of all other available tools, we chose Sunrise TestGen due to its performance and fit with our existing design environment."

The main selection criteria were the tools' performance based on run-time, vector count and the amount of logic insertion required to meet test coverage goals. In addition, the ability to generate tests for the logic that falls in the shadow of memories was important. Viewlogic and Mitsubishi also partnered in developing new tools to format

Mitsubishi proprietary memory test patterns for use within Viewlogic's Sunrise DFT and ATPG environment. The Information Technology R&D Center implemented these techniques and have been using them in conjunction with TestGen during the past two years. They have completed DFT and ATPG on several chips between 50,000 and 100,000 gates with more than 95% fault coverage on each chip.

Mark Milligan, vice president of Viewlogic's Sunrise Test unit added, "Mitsubishi Information Technology R&D Center was one of our early customers in Japan and has been very successful in inserting design for test and automatic test generation into their design flow." Mr. Milligan continued, "By using the TestGen tool suite, Mitsubishi Information Technology R&D Center has been able to increase device quality while reducing time to market."

Mitsubishi Electric Corporation is based on the corporate philosophy of creative and innovative development of new technology to benefit all humanity.

Sunrise TestGen is a highly flexible test automation solution used by design and test engineers at leading electronics customers worldwide. TestGen generates high quality tests for complex integrated circuits including ASIC, ASSP and microprocessor applications. TestGen supports a wide variety of popular Design-For-Test (DFT) methodologies including full- and optimized-scan, IEEE 1149 boundary scan, Iddq current and path delay testing. The solution includes tools for RTL and graphical gate level testability analysis, test synthesis, IEEE 1149.1 boundary scan implementation, network-distributed fault simulation and test vector generation, and failure diagnosis.

Viewlogic Systems, Inc. is a worldwide supplier of electronic design automation software. The company's design tools enable electrical engineers to design state-of-the-art electronic products more efficiently, while reducing both development costs and time to market. The company offers software for both UNIX- and Windows-based computing platforms, along with a broad range of support services. Viewlogic is the first Computer Aided Engineering (CAE) software company in the U.S. to achieve registration to ISO 9001, the most comprehensive of the ISO quality standards. For more company information, the Internet home page address for Viewlogic is http://www.viewlogic.com .

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CONTACT: Karen Wills

Viewlogic Systems, Inc.

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