Printer Friendly
The Free Library
14,634,800 articles and books
Member login
User name  
Password 
 
Join us Forgot password?

Microscopes.


Q-Scope Series scanning probe microscopes are featured in this eight-page, four-color brochure. These advanced SPM/AFM products are said to feature fast scan rates The number of times per second an image capture or display device samples its field of vision. See scan line and horizontal scan frequency. See also scan technology.  and a sub-angstrom noise floor, a full complement of SPM SPM - Sequential Parlog Machine  imaging modes, convenient sample handling and applications flexibility, superior imaging and precision measurement capabilities, according to according to
prep.
1. As stated or indicated by; on the authority of: according to historians.

2. In keeping with: according to instructions.

3.
 the literature.

Ambios Technology

www.ambiostech.com

[ILLUSTRATION OMMITED]
COPYRIGHT 2007 Lippincott & Peto, Inc.
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2007, Gale Group. All rights reserved. Gale Group is a Thomson Corporation Company.

 Reader Opinion

Title:

Comment:



 

Article Details
Printer friendly Cite/link Email Feedback
Publication:Rubber World
Date:Mar 22, 2007
Words:59
Previous Article:High injection pressure molding machine.
Next Article:Elastomers.
Topics:



Related Articles
Charging ahead on antimatter microscope.
Making 'movies' of biological molecules. (scanning probe microscopes)
Microscope's misleading tips. (imperfections can lead to errors) (Brief Article)
Microscope yields sharp 3-D images. (new microscope images living cells in three dimensions in low light conditions)(Brief Article)
Surgical microscope.(Leica M400E)
Carbon nanotubes beam electrons. (Materials Science).(Brief Article)
GEI International, Inc.(New Products)
Polyurethane system makes microscopes lighter/safer.(Materials)
Surgical microscope.(PRODUCT MARKETPLACE)
Hitachi High-Technologies Launches Mask Design Data Measuring System.

Terms of use | Copyright © 2009 Farlex, Inc. | Feedback | For webmasters | Submit articles