Microscope goes mini.The atomic force microscope atomic force microscope (AFM), device that uses a spring-mounted probe to image individual atoms on the surface of a material. Unlike the scanning tunneling microscope, which is also a scanning probe microscope, the AFM can be used on materials that do not conduct (ATM) has contributed dramatically to shrinking the scale at which scientists can make out details of objects. Invented in 1986, the instrument records the shapes of samples by dragging a sharp-tipped cantilever over their surfaces (SN: 10/24/98, p. 268). Now, the AFM (Atomic Force Microscope) A device used to image materials at the atomic level. AFMs are used to solve processing and materials problems in electronics, telecom, biology and other high-tech industries. has undergone some startling star·tle v. star·tled, star·tling, star·tles v.tr. 1. To cause to make a quick involuntary movement or start. 2. To alarm, frighten, or surprise suddenly. See Synonyms at frighten. shrinkage of its own. A team at the Swiss Federal Institute of Technology The Swiss Federal Institute of Technology may refer to one of two institutes of higher education in Switzerland:
Such compactness comes at a price, however. Compared with the best full-size AFMs, which can spot individual atoms, the crop version can resolve features only 10 to 100 times as large, says team leader Andreas Hierlemann. Still, "the resolution is good for most purposes," such as examining nanoscale parts in microelectronics, he adds. The team describes the chip in the Dec. 7, 2004 Proceedings of the National Academy of Sciences The Proceedings of the National Academy of Sciences of the United States of America, usually referred to as PNAS, is the official journal of the United States National Academy of Sciences. . |
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