LTX Introduces Fusion EX - the New Benchmark for SOC Test Scalability; Reducing The Cost of Test for Complex, High Volume ICs.WESTWOOD, Mass. -- LTX LTX Liver Transplant LTX Lane Training Exercise LTX Laptop Expansion (Slot) Corporation (Nasdaq: LTXX), a leading supplier of semiconductor test solutions, today announced its new Fusion EX. This new Fusion configuration offers four times as many instrument channels as the popular Fusion CX, a new functional/structural digital test channel, and Fusion's proven mixed-signal instruments. Fusion EX meets the emerging needs for cost-effective testing of highly complex, high-volume integrated circuits Integrated circuits Miniature electronic circuits produced within and upon a single semiconductor crystal, usually silicon. Integrated circuits range in complexity from simple logic circuits and amplifiers, about 1/20 in. (1. , such as advanced consumer-digital and baseband communications devices. Key to its ability to test these types of devices in parallel is its high number of instrument slots, which also enable massive multisite testing of lower complexity devices. Fusion EX is fully outsource-manufactured, and has been ordered by several customers, with multiple units already delivered. "After successfully launching Fusion, the industry's first single-platform SOC tester several years ago, we listened to our customers and heard them loud and clear - single-platform testers were their future but one-size doesn't fit every application," commented Roger W. Blethen, chairman and chief executive officer of LTX. "Today we announced Fusion EX, our fourth in a series of second generation, scalable Fusion systems. Based on its quick acceptance by several customers, including IDMs and fabless IC companies, Fusion EX seems to have hit the mark." FUSION EX SCALABLE PERFORMANCE Fusion EX incorporates 80 universal instrument slots, enabling a wider range of system configurations. Fusion EX also uses existing Fusion platform instruments, which are architected with a limited number of instrument channels per card to provide small configuration increments. This instrument channel granularity, combined with Fusion's universal slot design, produces system configurations with a lower cost of ownership than competitive platforms. Fusion EX provides full functional test capabilities and the built-in support necessary for effective structural test, including: --Full featured digital performance up to 200MHz (MegaHertZ) One million cycles per second. It is used to measure the transmission speed of electronic devices, including channels, buses and the computer's internal clock. A one-megahertz clock (1 MHz) means some number of bits (16, 32, 64, etc. , including embedded Inserted into. See embedded system. memory test, and time measurement per pin --Proven SERDES See serializer/deserializer. options to 12Gb/s --Design for test (DFT DFT - discrete Fourier transform ) support through independent scan per pin --Seamless interface to third-party built-in self test Built-in Self Test - (BIST) The technique of designing circuits with additional logic which can be used to test proper operation of the primary (functional) logic. (BIST BIST - Built-in Self Test ) solutions with fully integrated diagnostic support In addition, Fusion EX utilizes the same, proven mixed signal instrument set as the Fusion CX and Fusion DX configurations, including multiple synthesizers and digitizers, and a full suite of DC and power test options. Fusion EX also provides program compatibility utilizing LTX's established enVision device oriented programming environment. Used across the Fusion platform, enVision provides powerful debug To correct a problem in hardware or software. Debugging software means locating the errors in the source code (the program logic). Debugging hardware means finding errors in the circuit design (logical circuits) or in the physical interconnections of the circuits. tools, encapsulation (1) In object technology, the creation of self-contained modules that contain both the data and the processing. See object-oriented programming. (2) The transmission of one network protocol within another. of test objects for easy reuse of test intellectual property, and transparent multisite to reduce the cost of test. FUSION EX RELIABILITY As a second generation Fusion system, Fusion EX offers unprecedented reliability. LTX has developed a comprehensive, custom support package for Fusion EX, which takes advantage of the system's built-in reliability and LTX customer support expertise to maximize system uptime and performance while minimizing operational costs. ABOUT LTX LTX Corporation (Nasdaq: LTXX) is a leading supplier of test solutions for the global semiconductor industry. Fusion, LTX's patented, scalable, single-platform test system, uses innovative technology to provide high performance, cost-effective testing of system-on-a-chip, mixed signal, RF, digital and analog integrated circuits. Fusion addresses semiconductor manufacturers' economic and performance requirements today, while enabling their technology roadmap The context of product management The existence of product managers in the product software industry indicates that software is becoming more and more commercialized as a standard product. of tomorrow. LTX's web site is www.ltx.com. LTX and Fusion are registered trademarks and enVision is a trademark of LTX Corporation. All other trademarks are the property of their respective owners. |
|
||||||||||||||||
Printer friendly
Cite/link
Email
Feedback
Reader Opinion