Kinetix Test Systems Joins LogicVision's Embedded Test LogicVision Ready Partner Program.Business Editors/High-Tech Writers International Test Conference ATLANTIC CITY, N.J.--(BUSINESS WIRE)--Oct. 2, 2000 LogicVision and Kinetix to Develop Tester Support for Embedded Test Solutions(TM) LogicVision, Inc., a leading provider of Embedded Test Solutions(TM) technology for complex integrated circuits (ICs) and systems, and Kinetix Test Systems Inc., a manufacturer of low cost automatic test equipment (ATE) for the semiconductor industry, announced today that Kinetix and LogicVision will jointly develop and market products to link LogicVision's Embedded Test Solutions(TM) with Kinetix's semiconductor test systems. The combined solution is designed to enhance system-on-a-chip (SOC) test and diagnosis. Embedded test enables more efficient design and manufacture of complex semiconductors. At this year's International Test Conference, booth no. 625, LogicVision and Kinetix will demonstrate products with new capabilities that combine LogicVision's Embedded Test Solutions(TM) with Kinetix's tester functionality. The integrated capability will run on the tester and is designed to enhance the tester's ability to operate the on-chip Embedded Test Solutions(TM). The production test product will be designed to create and execute embedded test methods. LogicVision has also established a LogicVision Ready(TM) Partner Program to provide mutual customers and its partners Embedded Test Solutions(TM) for test and diagnostic of complex application-specific integrated circuits (ASICs) and SOCs. Kinetix is the latest test systems manufacturer to join LogicVision's Partner Program. Other members include Teradyne (NYSE NYSE See: New York Stock Exchange :TER Third version. See bis. ) and Credence (Nasdaq:CMOS (Complementary Metal Oxide Semiconductor) Pronounced "c-moss." The most widely used integrated circuit design. It is found in almost every electronic product from handheld devices to mainframes. ). "The continued expansion of our LogicVision Ready(TM) Partner Program is an essential part of our goal to provide low cost, completely integrated test solutions that incorporate the benefits of LogicVision's embedded test technology," said Mukesh Mowji, LogicVision's vice president of manufacturing business. "We are pleased to work with Kinetix toward the objective of meeting customer demands for low cost test solutions." "Joining the LV Ready(TM) Partner Program enhances our position by adding exciting new capabilities to our product offerings," said Tom Mees, CEO (1) (Chief Executive Officer) The highest individual in command of an organization. Typically the president of the company, the CEO reports to the Chairman of the Board. and president of Kinetix. "We see that enhancing our low cost tester and Embedded Test Solutions(TM) address on-chip test and provide a very cost effective solution for a wide range of complex integrated circuits." About Kinetix Test Systems Inc. Kinetix Test Systems is a leader in the development of innovative technology for the semiconductor automatic test equipment (ATE) industry. In addition to producing its own family of test systems, Kinetix also provides upgrades that extend the useful life and increase the economic productivity of test systems from a variety of manufacturers. Kinetix technological innovations are found in many of the world's leading ATE systems. Kinetix is headquartered in Milpitas, Calif., and can be found on the web at www.kinetix.com. About LogicVision Inc. LogicVision provides proprietary technologies for embedded test that enable the more efficient design and manufacture of complex semiconductors. LogicVision's Embedded Test Solution(TM) allows integrated circuit designers to embed into a semiconductor design test functionality that can be used during semiconductor production and throughout the useful life of the chip. For more information on the company and its products, please visit the LogicVision website at www.logicvision.com. Acronyms and definitions: ATE -- Automatic Test Equipment ATPG ATPG Automatic Test Pattern Generation ATPG Automatic Test Program Generator : Automatic Test Pattern Generation ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital BIST BIST - Built-in Self Test : Built-in-Self-Test DFT: Design-for-Test EDA: Electronic Design Automation HDL (Hardware Description Language) A language used to describe the functions of an electronic circuit for documentation, simulation or logic synthesis (or all three). Although many proprietary HDLs have been developed, Verilog and VHDL are the major standards. : Hardware Description Language (language) Hardware Description Language - (HDL) A kind of language used for the conceptual design of integrated circuits. Examples are VHDL and Verilog. IC: Integrated Circuit RTL: Register Transfer-Level VHDL (VHSIC Hardware Description Language) A hardware description language (HDL) used to design electronic systems at the component, board and system level. VHDL allows models to be developed at a very high level of abstraction. : VHSIC (Very High Speed Integrated Circuit) Pronounced "viz-ick." Ultra-high-speed chips employing LSI and VLSI technologies. The term comes from the name of the program launched by the U.S. Department of Defense in 1980 to advance digital IC technology. (Very High-Speed Integrated Circuit) HDL IP: Intellectual Property SOC: System-on-chip |
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