Printer Friendly
The Free Library
14,734,913 articles and books
Member login
User name  
Password 
 
Join us Forgot password?

Keithley Series 2600 System SourceMeter(R) Instruments Cited Among World's Top 100 Technologies of 2006.


CLEVELAND -- Keithley Instruments Keithley Instruments (NYSE: KEI) is a measurement and instrument company headquartered in Solon, Ohio. Keithley develops, manufactures, markets and sells highly accurate instruments and data acquisition products, as well as complete system solutions for high-volume production , Inc. (NYSE NYSE

See: New York Stock Exchange
:KEI), a leader in solutions for emerging measurement needs, announces that "Research & Development Magazine" has named Keithley Instruments, Inc., Cleveland, Ohio "Cleveland" redirects here. For the Cleveland metropolitan area, see . For other uses, see Cleveland (disambiguation).
Cleveland is a city in the U.S. state of Ohio and the county seat of Cuyahoga County, the most populous county in the state.
, as one of the recipients of the 2006 R&D 100 Award for the Series 2600 System SourceMeter(R) Instruments. Winners of this prestigious award are chosen each year by a panel of industry experts who review hundreds of entries from universities, private corporations, and labs around the world to select the 100 most technologically significant products and processes introduced during the previous year. Established in 1963, the R&D 100 Awards have a strong track record of identifying innovative research, products, and solutions. Including this most recent award, Keithley has now won an R&D 100 Award 20 times during the competition's history.

Exceptional Performance and Speed at Low Cost. This 2006 R&D 100 Award recognizes Keithley's achievement in creating a new instrument design that reduces the time and cost of making highly accurate electrical measurements Electrical measurements

Measurements of the many quantities by which the behavior of electricity is characterized. Measurements of electrical quantities extend over a wide dynamic range and frequencies ranging from 0 to 1012 Hz.
 in critical applications, such as semiconductor and nanotechnology nanotechnology: see micromechanics.
nanotechnology

Manipulation of atoms, molecules, and materials to form structures on the scale of nanometres (billionths of a metre).
 materials development, electronic product R&D, and manufacturing quality assurance. The Series 2600 instruments are able to measure current and voltage in a tightly coordinated, swift method, an important capability for electronic component manufacturers who must make these types of measurement as rapidly as thousands of times a second.

Mark Hoersten, Keithley Vice President, Business Management noted, "Before the Series 2600, most automated au·to·mate  
v. au·to·mat·ed, au·to·mat·ing, au·to·mates

v.tr.
1. To convert to automatic operation: automate a factory.

2.
 test equipment (ATE) systems of this type were large, high-cost, difficult to use, and relatively slow in making measurements." Each of the Series 2600 units is the equivalent of six electrical measuring instruments in a single box, and is capable of storing and running hundreds of predefined tests. When used in an ATE system, either singly or linked together in multiples, they can reduce test times by up to a factor of ten compared to older designs, reduce test equipment hardware and software costs by up to 75 percent, and occupy just a fraction of the space on a plant floor.

For More Information. For details on the Series 2600 or any of Keithley's SourceMeter Instruments, visit http://www.keithley.com/pr/058. Or contact the company at:
Telephone:    800-688-9951
                        440-248-0400
          FAX:          440-248-6168
          E-mail:       publisher@keithley.com
          Internet:     www.keithley.com
          Address:      Keithley Instruments, Inc.
                        28775 Aurora Road
                        Cleveland, OH 44139-1891


About Keithley. With 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Its products solve emerging measurement needs in production testing, process monitoring, product development, and research. The company's customers are scientists and engineers in the worldwide electronics industry involved with advanced materials Advanced Materials is a leading peer-reviewed materials science journal published every two weeks. Advanced Materials includes Communications, Reviews, and Feature Articles from the cutting edge of materials science, including topics in chemistry, physics,  research, semiconductor device and wafer (1) A small, thin continuous-loop magnetic tape cartridge that has been used from time to time for data storage and specialized applications.

(2) The base unit of chip making. It is a slice taken from a salami-like silicon crystal ingot up to 12" (300mm) in diameter.
 characterization A rather long and fancy word for analyzing a system or process and measuring its "characteristics." For example, a Web characterization would yield the number of current sites on the Web, types of sites, annual growth, etc.  and functional test, and the production of end products such as electronic assemblies or portable wireless devices. The value Keithley provides its customers is a combination of precision measurement technology and a rich understanding of their applications to improve the quality, throughput The speed with which a computer processes data. It is a combination of internal processing speed, peripheral speeds (I/O) and the efficiency of the operating system and other system software all working together.

1.
, and yield of their products.

Products and company names listed are trademarks or trade names of their respective companies.
COPYRIGHT 2006 Business Wire
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2006, Gale Group. All rights reserved. Gale Group is a Thomson Corporation Company.

 Reader Opinion

Title:

Comment:



 

Article Details
Printer friendly Cite/link Email Feedback
Publication:Business Wire
Article Type:Company overview
Geographic Code:1USA
Date:Aug 1, 2006
Words:512
Previous Article:B. Riley & Co 4th Annual New York Investor Conference Scheduled for August 10, 2006; Updated List of Presenting Companies.
Next Article:Novant Health Selects Allscripts Electronic Health Record; Agreement with North Carolina Group is Largest in Allscripts History.
Topics:



Related Articles
Keithley Publishes 2006 Test and Measurement Product Catalog.
Keithley Announces New Training Course on Optimizing Remote Control of Instruments in a LabVIEW(R) Environment.
Keithley's Metrology Services Earns Rigorous ISO 17025 Accreditation.
Keithley Introduces PXI Products for Hybrid Test Systems in Production Applications.
Keithley Introduces New Version of Test Software for Improved Pulse Measurements.
Keithley Introduces Measurement How-To Library on CD.
Keithley Recognized for Outstanding Customer Satisfaction in Semiconductor Industry.(Company overview)
Keithley Introduces Handbook for Parametric Parallel Test.
Winners of Keithley Instruments Nanotech Measurement Contest Share $5000 in Cash Prizes for Innovative Test Techniques.
Keithley Launches Integrated Test Systems for Faster and Easier Semiconductor Testing.

Terms of use | Copyright © 2009 Farlex, Inc. | Feedback | For webmasters | Submit articles