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Keithley Publishes New Semiconductor Test Tutorial Handbook.


CLEVELAND -- Keithley Instruments Keithley Instruments (NYSE: KEI) is a measurement and instrument company headquartered in Solon, Ohio. Keithley develops, manufactures, markets and sells highly accurate instruments and data acquisition products, as well as complete system solutions for high-volume production , Inc. (NYSE NYSE

See: New York Stock Exchange
:KEI), a leader in solutions for emerging measurement needs, has published a semiconductor test reference handbook titled Overcoming the Measurement Challenges of Advanced Semiconductor Technologies: DC, Pulsed, and RF--From Modeling to Manufacturing. The 140-page handbook describes emerging measurement challenges for semiconductor manufacturers as they move into the 65nm technology node See technology generation.  and beyond. The handbook is available for no charge at http://www.keithley.com/pr/014. For High Resolution Image: http://www.ggcomm.com/KEI_Images/SemiHandbook.JPG See JPEG.

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.

The handbook draws from the collective experience of Keithley's parametric test and device characterization experts and the company's customers. It covers a variety of emerging technologies and processes, such as:

--Challenges in RF wafer testing

--Gate dielectric dielectric (dī'ĭlĕk`trĭk), material that does not conduct electricity readily, i.e., an insulator (see insulation). A good dielectric should also have other properties: It must resist breakdown under high voltages; it should not  reliability testing

--Charge pumping and reliability

--High frequency capacitance measurement Capacitance measurement

The measurement of the ratio of the charge induced on a conductor to the change in potential with respect to a neighboring conductor which induces the charge.


--Copper via testing

--Advanced SMU SMU Southern Methodist University
SMU Solid (Waste) Management Unit
SMU Saint Mary's University (Halifax, Nova Scotia; Philippines)
SMU Singapore Management University
SMU Saint Mary's University of Minnesota
 DC measurements

The handbook also contains a glossary A term used by Microsoft Word and adopted by other word processors for the list of shorthand, keyboard macros created by a particular user. See glossaries in this publication and The Computer Glossary.  of commonly used terms in the semiconductor industry, including test and measurement terminology.

To request a free copy, call 1-888-KEITHLEY or visit www.keithley.com/pr/014.html.

For More Information. For more information on Keithley's semiconductor test and measurement systems and instruments, contact the company at:
Telephone: 800-688-9951
           440-248-0400
FAX:       440-248-6168
E-mail:    product_info@keithley.com
Internet:  www.keithley.com

Address:   Keithley Instruments, Inc.
           28775 Aurora Road
           Cleveland, OH 44139-1891


About Keithley. With more than 50 years of measurement expertise, Keithley Instruments (www.keithley.com) has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency) geared to the specialized needs of electronics manufacturers for high performance production testing, process monitoring, product development, and research. By building upon our strength in electrical measurement solutions for research, Keithley has become a production test technology leader for the semiconductor, wireless, optoelectronics, and other precision electronics segments of the worldwide electronics industry. The value we provide to our customers is a combination of precision measurement technology and a rich understanding of their applications to improve the quality, throughput, and yield of their products.

Products and company names listed are trademarks or trade names of their respective companies.
COPYRIGHT 2005 Business Wire
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2005, Gale Group. All rights reserved. Gale Group is a Thomson Corporation Company.

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Publication:Business Wire
Geographic Code:1USA
Date:Jul 12, 2005
Words:345
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