KIC awarded patent for thermal profiling technology.

KIC (San Diego, CA, www.kicthermal.com), a provider of thermal process development and control software, has been awarded a U.S. patent on a technology that improves its 24/7 Virtual Profiler. The inventors of this patent are Philip Kazmierowicz, vice president of research and development, and Miles Morea, manager of European sales.

The patent for "Method for Correcting Process Temperature Profile in a Multi-Zone Thermal Processor" focuses on technology that improves the accuracy of the company's profiler, allowing it to display and record a virtual thermal profile for every product assembled. Key statistics of thermal profiles can be tracked during production to provide real-time process monitoring. The system can alarm when the process is out of statistical control, but before the process is actually out of specification.

KIC's technology automatically provides the process data for every produced part without interfering with production. The process' fit to the established process window is also automatically calculated in real-time, and the profiler will immediately alarm on any out of spec situation, as well as warn an impending out of control process as calculated by its Cpk number.