Articles from Journal of Research of the National Institute of Standards and Technology (January 1, 2004)

Title	Author	Type	Words
Accuracy in Powder Diffraction III--Part 1: preface.	Cline, James		328
Bayesian inference of nanoparticle-broadened x-ray line profiles.	Bonevich, John E.		15530
Diffraction line broadening analysis if broadening is caused by both dislocations and limited crystallite size.	Seijbel, L.J.		5921
Direct methods optimised for solving crystal structure by powder diffraction data: limits, strategies, and prospects.	Rizzi, Rosanna		5663
Direct space structure solution applications.	Tremayne, Maryjane		6631
Fundamental parameters line profile fitting in laboratory diffractometers.	Cline, J.P.		14131
Global Rietveld refinement.	Shankland, Kenneth		5667
Multidataset refinement resonant diffraction, and magnetic structures.	Attfield, J. Paul		4413
Polycapillary optics for materials science studies: instrumental effects and their correction.	Scardi, P.		11039
Powder diffraction: least-squares and beyond.	David, W.I.F.		7859
The high resolution powder diffraction beam line at ESRF.	Fitch, A.N.		5211
X-ray spectrometry of copper: new results on an old subject.	Diamant, R.		10599