Articles from Journal of Research of the National Institute of Standards and Technology (November 1, 2002)

Title	Author	Type	Words
Accurate cross sections for microanalysis.	Rez, Peter		4183
Averaging of backscatter intensities in compounds.	Westphal, Andrew J.		3961
Barriers to quantitative electron probe x-ray microanalysis for low voltage scanning electron microscopy.	Newbury, Dale E.		5435
Characterization of Corning EPMA standard glasses 951RV 951RW and 951RX.	Nabelek, Carol		11300
Contamination in the rare-earth element orthophosphate reference samples.	Jarosewich, Eugene		7414
Copper oxide precipitates in NBS Standard Reference Material 482.	Bright, David S.		7679
Decomposition of wavelength dispersive X-Ray spectra.	Roques-Carmes, Claude		11622
Foreword.	Marinenko, Ryna B.		578
High count rate electron probe microanalysis.	Herrington, Charles		3199
Implications of polishing techniques in quantitative x-ray microanalysis.	Roques-Carmes, Claude		12326
Kurt Francis Joseph Heinrich.	Marinenko, Ryna B.		661
Limitations to accuracy in extracting characteristic line intensities from x-ray spectra.	Statham, Peter J.		9046
Microbeam characterization of Corning archeological reference glasses: New additions to the Smithsonian microbeam standard collection.	Wysoczanski, Richard		4391
NIST standards for microanalysis and the certification process.	Marinenko, R.B.		3443
Optimization of wavelength dispersive x-ray spectrometry analysis conditions.	Reed, Stephen J.B.		4112
Sample preparation for electron probe microanalysis--pushing the limits.	Engle, Paul D.		4917
Smithsonian Microbeam Standards.	Jarosewich, Eugene		2606
Terminology.	Vorburger, Theodore		409
The analysis of particles at low accelerating voltages ([less than or equal to] 10 kV) with energy dispersive x-ray spectroscopy (EDS).	Small, J.A.		5733
The microcalorimeter for industrial applications.	Hollerich, Christian		1876
Uncertainty in quantitative electron probe microanalysis.	Heinrich, Kurt F.J.		1674
X-ray microanalysis in the variable pressure (environmental) scanning electron microscope.	Newbury, Dale E.		12151