Japanese Joint Venture to Produce 300mm Semiconductor Wafers Selects SemiTest Wafer Monitoring System.Business/Technology Editors BILLERICA, Mass.--(BUSINESS WIRE)--March 8, 2001 SemiTest, Inc., a leading supplier of semiconductor wafer monitoring equipment, today announced that it has shipped one of its SCA-3000 surface charge analyzer systems to a 300mm wafer fabrication Wafer Fabrication is a procedure composed of many repeated sequential processes to produce complete electrical or photonic circuits. Examples include production of radio frequency (RF) amplifiers, LEDs, optical computer components, and CPUs for computers. facility in Japan. The facility is a joint venture of two major chipmakers from Japan and Taiwan. The SCA-3000 is used to monitor the manufacturing process for 300mm wafers. "Our SCA-2500 system has been used by one of the joint venture's principals to monitor their 8-inch wafer production. So they have full confidence that the SCA-3000 will allow them to quickly ramp-up their 300 mm diffusion diffusion, in chemistry, the spontaneous migration of substances from regions where their concentration is high to regions where their concentration is low. Diffusion is important in many life processes. operations," commented Jeffrey D. Barker, SemiTest Vice President of Sales. SemiTest's SCA (Single Connector Attachment) An 80-pin plug and socket used to connect peripherals. With a SCSI drive, it rolls three cables (power, data channel and ID configuration) into one connector for fast installation and removal. series of Surface Charge Analyzers has become the industry standard for real-time monitoring of the diffusion process Diffusion process A conception of the way a stock's price changes that assumes that the price takes on all intermediate values. in semiconductor manufacturing. The SCA-3000 detects contaminants (including Na, Fe, Ca, Al, K, and Cu), and immediately senses process changes, equipment malfunctions and operator errors. The results are lower operating costs operating costs npl → gastos mpl operacionales and extended mean time to maintenance cycles through better problem detection. Charles Kohn, President and Chief Executive Officer of SemiTest, added, "We are very pleased to be continuing our long association with this customer as they launch their new joint venture in Japan. We appreciate their confidence in our SCA product, and look forward to working closely with them for many more years to come." About SemiTest SemiTest, Inc., with headquarters in Billerica, Mass., was founded in 1987. SemiTest designs and manufactures monitoring tools used in semiconductor production. The company's Epimet (TM) Non-contact Resistivity resistivity Electrical resistance of a conductor of unit cross-sectional area and unit length. The resistivity of a conductor depends on its composition and its temperature. Tool dramatically reduces the cost of epi wafer monitoring without risking quality. Epimet received the prestigious "Editor's Choice Best Product for 2000" award from Semiconductor International magazine. SemiTest's SCA-2500 Surface Charge Analyzer system is used for monitoring diffusion furnace furnace, enclosed space for the burning of fuel. There are many kinds of furnaces, the type depending upon the fuel and the use to which the heat produced within it is put. Most familiar are the furnaces used in the heating of buildings. operations and has an installed base of nearly 200 systems worldwide. The technology in SemiTest products is covered by U.S. and foreign patents. Further information on SemiTest can be obtained by calling 978-667-8783. SemiTest's web site is located at www.SemiTest.com. |
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