Italtel, Italy's premier telecom research and development center, adopts Sunrise Test Systems TestGen tool suite as standard test automation software.FREMONT, Calif.--(BUSINESS WIRE)--June 12, 1995--Italtel and Sunrise Test Systems, Inc., a Viewlogic Company, today announced the adoption of Sunrise's suite of tools for its complex ASIC (Application Specific Integrated Circuit) Pronounced "a-sick." A chip that is custom designed for a specific application rather than a general-purpose chip such as a microprocessor. and custom designs. According to Guiseppe Fazzini, Design Automation manager at Italtel's Research and Development Laboratories in Milan, "Our charter is the development of advanced telecommunication controller chips of the highest quality and reliability to meet the requirements of our systems and the needs of our customers. For that reason, we have integrated Design for Test (DFT DFT - discrete Fourier transform ) and automatic test generation (ATG ATG antithymocyte globulin. lymphocyte immune globulin (antithymocyte globulin equine, ATG, ATG equine, LIG) Atgam Pharmacologic class: Immunoglobulin Therapeutic class: Immunosuppressant ) tools within our design flows." Fazzini added, "After careful consideration and extensive testing of all other available tools, we decided to adopt Sunrise due to its performance and fit within our existing, mostly Mentor based, design environment." In the past two years Italtel has completed the design of about twenty-five telecommunication systems controller chips, utilizing Sunrise's suite of tools. The main selection criteria were the tools' performance based on run-time, vector count and the amount of logic insertion required to meet test coverage goals. In addition, the ability to generate tests for the logic that falls in the shadow of memories and JTAG (Joint Test Action Group) An IEEE standard for boundary scan technology. See scan technology. JTAG - Joint Test Action Group implementation along with BSDL (Boundary Scan Description Language) An IEEE language used to describe structures for boundary scan testing. See scan technology. generation was important. Jean Pierre Braun, Sunrise Test Systems Inc.'s general manager added, "In Italtel, we have found the ideal partner. Mr. Fazzini and his team have developed a unique level of expertise in test automation and their production successes with the TestGen tool suite greatly contribute to reducing time-to-market and increasing quality and profitability for all of Italtel." Braun continued, "Italtel was one of the earliest users of our tools and has been key in driving our capabilities." TestGen is a suite of software tools consisting of four tightly integrated modules: START, a testability analysis tool and test synthesis tool, a high-speed fault simulator, and a test vector generator Test Vector Generator or TVG is a term used to describe a program used to automatically generate test data for use in automated testing of software. External link
Italtel - Societa Italiane Telecommunicazioni (SIT) is one of Europe's leading full-time manufacturers in the telecommunication sector. The company designs, manufactures, markets and installs telecom systems and equipment for the public and private sectors. Its main products cover switching, transmission, IT-based systems, mobile telephony networks and network infrastructure management systems. Italtel's core products for switching systems are currently in service in 18 countries, with a total amount of 15 million lines installed. In addition, the last few years Italtel has achieved and consolidated a primary role in the development of the Republic of China and Argentina. The company's headquarters are in Milan; the industrial plants are located in Milan, L'Aquila, Carini (Palermo), Santa Maria Capua Vetere Santa Maria Capua Vetere is a town and commune in the province of Caserta, part of the region of Campania (southern Italy). Santa Maria Capua Vetere ("Capua the Old") is located on the site of the ancient Roman city of Capuae. (Caaserta), Terni, Padova and Neufeld (Wein, Austria). Sunrise Test Systems, Inc., a Viewlogic company, was founded in October, 1990 with a total focus on delivering test automation software and methodologies that improve design efficiency and profits for electronics companies. Recognizing the need for flexible test strategies based on diverse design requirements, Sunrise Test Systems devised Design-Optimized Test Strategies. This approach provides multiple test methodologies to meet the different test needs created by varied design requirements. Through these strategies encapsulated in the TestGen tool set, designers can achieve high fault coverage with a positive impact on design style, performance, chip cost and time-to-market. Patented automatic test pattern generation ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital (ATPG ATPG Automatic Test Pattern Generation ATPG Automatic Test Program Generator ) algorithms produce the highest fault coverage and vector compaction with minimal run-time for full and partial-scan circuits. Sunrise Test Systems, Inc., is located at 47211 Lakeview Boulevard, Fremont, CA 94538-6530. For information call (510) 440-1000 or Internet mail: info_request@srtest.viewlogic.com. -0- Note to Editors: TestGen and Design-Optimized Test Strategies is a trademark of Sunrise Test Systems, Inc. RS6000 is a trademark of International Business Machines. CONTACT: Sunrise Test Systems Inc. Mark Milligan, 510/440-1000 or Italtel S.I.T. Spa Guiseppe Fazzini, 39 2 43 88 8807 or Shafer Public Relations public relations, activities and policies used to create public interest in a person, idea, product, institution, or business establishment. By its nature, public relations is devoted to serving particular interests by presenting them to the public in the most Judith Kahn, 800/503-1177 |
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