Iran Produces Atomic Force Microscope.Summary: TEHRAN (FNA)- Iranian researchers have developed an Atomic Force Microscope atomic force microscope (AFM), device that uses a spring-mounted probe to image individual atoms on the surface of a material. Unlike the scanning tunneling microscope, which is also a scanning probe microscope, the AFM can be used on materials that do not conduct (AFM (Atomic Force Microscope) A device used to image materials at the atomic level. AFMs are used to solve processing and materials problems in electronics, telecom, biology and other high-tech industries. ) putting the country among ten leading countries possessing this nano-technology. Atomic force microscopy employs a cantilever so small that its tip tapers to a nanoscale point which provides scientists with an advanced imaging method in nanoscale points. As the microscope scans, the cantilever bounces up and down in response to the miniscule forces between the tip and the sample, generating a picture of the sample's surface. The project provides an innovative way in nano processing. It can make movements at nanoscale of any function and sensor possible. The atomic force microscope, which offers a precise duplication of any material surface, is an advanced technique capable of developing the most accurate picture in research processes, press tv reported. Producing such a device puts Iran among ten leading countries possessing this nano-technology. 2006 Fars News Agency Fars News Agency (FNA) is an Iranian news agency. It was officially launched in Tehran in February 2002 to "promote the principles of the Islamic Revolution and safeguard national interests". . All rights reserved Provided by Syndigate.info an Albawaba.com company |
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