Intellitech Announces Support for Xilinx Virtex 4 at-speed SERDES Tests in Its Eclipse IEEE 1149.1/JTAG products.SANTA CLARA Santa Clara, city, Cuba Santa Clara (sän`tä klä`rä), city (1994 est. pop. 217,000), capital of Villa Clara prov., central Cuba. , Calif. -- Intellitech Corporation, www.intellitech.com, the leader in lowering product costs through IEEE (Institute of Electrical and Electronics Engineers, New York, www.ieee.org) A membership organization that includes engineers, scientists and students in electronics and allied fields. 1149.1/JTAG, has announced the support for Xilinx Virtex 4 RocketIO in its at-speed BERT-IP test module for Eclipse. BERT (Bit Error Rate Test) An analysis of network transmission efficiency that computes the percentage of bits received in error from the total number sent. is an acronym for Bit Error Rate Test a well known industry metric in measuring high-speed link quality. The BERT-IP when used with Intellitech's Eclipse JTAG (Joint Test Action Group) An IEEE standard for boundary scan technology. See scan technology. JTAG - Joint Test Action Group tools is now capable of testing all combinations of Virtex 2 and Virtex 4 RocketIO interconnect at speeds up to six Gigabits per second. The BERT-IP consists of a downloadable bitstream for the FPGA (Field Programmable Gate Array) A type of gate array that is programmed in the field rather than in a semiconductor fab. Containing up to hundreds of thousands of gates, there are a variety of FPGA architectures on the market. with built-in pattern generators, high speed transceiver controls and pattern receivers that enable the real time detection and display of bit errors. The design engineer can set error limits and other parameters then export the BERT-IP at-speed tests for automatic execution at power-up or for in-the-field use through Intellitech's SystemBIST FPGA configuration device. The tests can also be exported for use during production JTAG tests and don't require a fully assembled system in order to be executed. At-speed tests can be performed on single PCBs or high-speed interconnect across multiple PCBs. Intellitech demonstrated the technology today on a customer designed PCB PCB: see polychlorinated biphenyl. PCB in full polychlorinated biphenyl Any of a class of highly stable organic compounds prepared by the reaction of chlorine with biphenyl, a two-ring compound. that incorporates several Virtex 4 devices and several 3.125G/s links at the International Test Conference exhibition hall. The technology is particularly important today as SERDES See serializer/deserializer. is not just used in high performance networks, but is used just to reduce the routing complexity of IC to IC interconnect. The BERT-IP technology enables customers to test these multi-gigabit SERDES connections at their rated speed and diagnose common PCB faults that can increase the bit error rate to unacceptable levels or prevent the connections from functioning all together. Intellitech's BERT-IP for Xilinx RocketIO enables testing for a large number of pins that can't be tested with standard IEEE 1149.1/JTAG because there aren't boundary-scan capabilities on those particular FPGA pins. An FPGA with twenty Xilinx MGTs (Multi-Gigabit Transceiver A Multi-Gigabit Transceiver (MGT) is a SerDes capable of operating at serial bit rates above 1 Gigabit/second. MGTs are used increasingly for data communications because they can run over longer distances, use fewer wires, and thus have lower costs than parallel interfaces ) has two pair of differential I/Os for a total of eighty pins that don't have boundary-scan test on them. The high speed operation of the nets constrains the construction of vias and test points on the PCB making other test techniques such as flying probe or in-circuit test difficult or impractical. The BERT-IP tests replaces software based functional tests which require significantly more resources to develop, may not be re-useable on next generation systems, have poor fault isolation and may not fully exercise the link for all possible faults. "Clock Jitter A flicker or fluctuation in a transmission signal or display image. The term is used in several ways, but it always refers to some offset of time and space from the norm. For example, in a network transmission, jitter would be a bit arriving either ahead or behind a standard clock cycle , power supply noise, cross talk, heat, poor PCB routing, impedance mismatches and signal reflections are all well known enemies of multi-gigabit SERDES designs", said Bill Tuthill, Intellitech BERT specialist, "software based functional test is good at finding an open link but seldom has the depth to identify random faults induced by these type of phenomena." He continued, "Costs go up linearly in terms of engineering time and overhead in order to get that depth and granularity in a functional SERDES test." "BER (1) (Basic Encoding Rules) A set of encoding rules for ASN.1 notation, which is a method for defining data structures. See ASN.1. (2) (Bit Error Rate) The average number of bits transmitted in error. See BERT. 1. tests take a lot of logic, not something you would load into the FPGA with the functional design anyway, so rather than design your own in-house solution, the BERT-IP solution will provide a re-useable drop in FPGA bitstream with software to enable these types of robust tests. The BERT-IP is a plug-n-play module that can be used to quickly get you up and running during prototyping as well as be loaded into the FPGA temporarily at power-up as a built-in test" Tuthill concluded. The BERT-IP module for Xilinx Virtex 4 and Virtex 2 is available now. The software license has a base price of $2995.00. Trademarks SystemBIST and Eclipse are trademarks of Intellitech Corporation. Intellitech is a registered trademark of Intellitech Corporation. RocketIO is a trademark of Xilinx, Inc. Xilinx and Virtex are registered trademarks of Xilinx, Inc. About Intellitech Intellitech's TEST-IP(TM)family provides patented infrastructure IP that enables customers to lower the cost of designing, debugging (programming) debugging - The process of attempting to determine the cause of the symptoms of malfunctions in a program or other system. These symptoms may be detected during testing or use by real users. , producing and maintaining electronic systems. Intellitech's proprietary solutions enable customers to build self-testable and in-the-field re-configurable products with the least amount of engineering resources and at the lowest cost. Intellitech lowers production costs by embedding test or enabling concurrent test of electronic assemblies during production test and burn-in. The unified test and configuration approach enables customers to lower manufacturing test costs, provide field adaptable products and retard product obsolescence ob·so·les·cent adj. 1. Being in the process of passing out of use or usefulness; becoming obsolete. 2. Biology Gradually disappearing; imperfectly or only slightly developed. with field upgrade-able logic. |
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