Innovative Multi-Site Wafer Level Reliability Test System is Introduced by SUSS.MUNICH, Germany -- SUSS suss tr.v. sussed, suss·ing, suss·es Slang 1. To infer or discover; figure out: "I think I'm good at sussing out what's going on" Ry Cooder. MicroTec AG (FWB (Fixed Wireless Broadband) See fixed wireless. :SMH SMH Sydney Morning Herald (Australia) SMH St Michael's Hospital SMH Shaking My Head SMH Strong Memorial Hospital SMH Sanders Morris Harris Inc. SMH Screening for Mental Health, Inc. ) has introduced an analytical probe system dedicated to Multi-Site Wafer Level Reliability (WLR WLR Water and Land Resources (King County, WA) WLR Wholesale Line Rental WLR Weekly Law Reports (UK) WLR Wafer Level Reliability WLR Weapons Locating Radar WLR Buoy Tender, River ) testing. With integrated devices becoming increasingly complex, the need to ensure that every transistor will last over the IC's lifetime has become almost as important as testing the functionality of the device itself. Reliability tests stress the device over several hours or even days in order to simulate how the device would act under normal conditions
In order to prevent the loss of processed and therefore expensive wafers, it has become essential to be able to perform reliability tests on the wafer itself. The importance of this test option will grow in the near future as process technologies move towards the 90 nm range. WLR also saves time as the noise floor of packaged part testers is often so large that a test can take up to 300 hours while the engineer waits for the leakage values to increase above the machine's noise floor. The much lower noise floor of a wafer-level set-up (consisting of parametric analyzer, analytical probe station, and probe card A probe card is an interface between an electronic test system and a semiconductor wafer. Its purpose is to provide an electrical path between the test system and the circuits on the wafer, thereby permitting the testing and validation of the circuits at the wafer level, usually ) allow the engineer to see precise leakage trends at wafer-level usually overnight. Multi-site probing speeds up the process even further and enables the test engineer to obtain reasonable sample sizes. It requires a probecard which can contact devices spread over the whole wafer simultaneously rather than in sequence. The tests demand low leakage measurement equipment which can withstand temperatures up to and exceeding 300 degrees C which is needed for accelerating failure mechanisms. The SUSS PM8WLR ProbeShield(R) system is especially developed for extremely accurate, high-temperature multi-site WLR measurements, such as: electro-migration, TDDB TDDB Time Dependent Dielectric Breakdown , hot carrier, wafer level burn-in, life test and/or device characterization. The z-axis remains completely stable, regardless of temperature extremes or test duration thus eliminating drift problems. Developed to meet the critical needs of 90 nm or smaller process technologies used by semiconductor manufacturers, the SUSS PM8WLR ProbeShield system, in combination with Celadon celadon Chinese, Korean, Siamese, and Japanese stoneware decorated with glazes the colour range of which includes greens of various shades, olive, blue, and gray. The colours are the result of a wash of slip (liquefied clay) containing a high proportion of iron that is probe cards and measurement equipment such as the Keithley 4200, provides long-term process reliability at all temperatures up to 300 degrees C. The PM8WLR ProbeShield is a light-tight, EMI (ElectroMagnetic Interference) An electrical disturbance in a system due to natural phenomena, low-frequency waves from electromechanical devices or high-frequency waves (RFI) from chips and other electronic devices. Allowable limits are governed by the FCC. shielded probe system which contains a thermal chuck with a temperature range from -60 degrees C to +300 degrees C. The ProbeShield's rinsing system ensures frost-free conditions when probing at negative temperatures. Because the probe card contacts all dies simultaneously, the microscope must move over the entire wafer to perform correct probe to pad alignment. This SUSS PM8 has a special microscope stage Noun 1. microscope stage - a small platform on a microscope where the specimen is mounted for examination stage platform - a raised horizontal surface; "the speaker mounted the platform" which can move 200 mm in both x & y to cover the whole wafer. The movement has been especially designed with user comfort in mind and has the control knobs ergonomically placed on the side of the prober so that one-handed use is possible. "With one dedicated multi-site PM8 WLR system from SUSS engineers are able to perform tests that would normally require 3 semiautomatic systems" states Dr. Claus Dietrich, International Product Manager at SUSS, further proving the cost saving potential of the new SUSS WLR system. A brochure on the system is available at www.suss.com/pm8wlr The PM8WLR will be demonstrated at Semicon West, San Jose San Jose, city, United States San Jose (sănəzā`, săn hōzā`), city (1990 pop. 782,248), seat of Santa Clara co., W central Calif.; founded 1777, inc. 1850. on the Keithley Booth #11219 from July 14th to 16th. About SUSS MicroTec SUSS MicroTec is a leading supplier of production, process and test technology for the semiconductor industry. SUSS maintains its leadership position with over 7,000 systems installed worldwide. SUSS products include coating developing systems, 1X full-field lithography (1XFFL) systems, substrate bonders, flip-chip bonders and probe systems. Headquartered in Munich, Germany, SUSS has 5 international manufacturing sites and provides support from sales and service centers in North America North America, third largest continent (1990 est. pop. 365,000,000), c.9,400,000 sq mi (24,346,000 sq km), the northern of the two continents of the Western Hemisphere. , Europe, Asia and Japan. SUSS MicroTec AG is listed in the Prime Standard segment of the German Stock Exchange. For more information, please visit http://www.suss.com. All statements in this release other than historical facts are forward-looking statements within the meaning of U.S. Private Securities Litigation Reform Act The Private Securities Litigation Reform Act of 1995 (PSLRA) implemented several significant substantive changes affecting certain cases brought under the federal securities laws, including changes related to pleading, discovery, liability, class representation and awards fees and of 1995. Words such as "believe", "expect", "intend", "anticipate", "estimate", "should", "may", "will", "plan" and similar words and terms used in relation to the enterprise are meant to indicate forward-looking statements of this kind. The company accepts no obligation toward the general public to update or correct forward-looking statements. All forward-looking statements are subject to various risks and uncertainties, as a result of which actual events may diverge numerically from expectations. The forward-looking statements reflect the view at the time they were made. |
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