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In case you missed it: inspection.


"Crack Growth Rate Measurement and Analysis for WLCSP WLCSP Wafer Level Chip Scale Packing (DDR RAM package)
WLCSP Wafer Level Chip Scale Packaging
 SnAgCu Solder solder (sŏd`ər), metal alloy used in the molten state as a metallic binder. The type of solder to be used is determined by the metals to be united. Soft solders are commonly composed of lead and tin and have low melting points. Hard solders (i.  Joints"

Abstract: This paper describes the measurement of crack growth rates Growth Rates

The compounded annualized rate of growth of a company's revenues, earnings, dividends, or other figures.

Notes:
Remember, historically high growth rates don't always mean a high rate of growth looking into the future.
 in SnAgCu solder joints subjected to thermal cycling with dye penetration tests and crack area image analysis. Devices used were stiff wafer-level packages to minimize the influence of any significant out-of-plane deformation and to ensure that the crack propagation takes place in a shear dominant mode. The solder joints were ~0.35 mm in height. Crack growth rate measurements were conducted for two temperature cycles: -40[degrees] to +125[degrees]C and 0[degrees] to +100[degrees]C resulting in strain rates in the range of 1[e.sup.-6]/s to 1[e.sup.-4]/s. For each strain rate condition, a total of 16 joints were analyzed. Crack initiation was observed at less than 20% of the total fatigue life in almost all conditions. For most of the test conditions, a linear crack growth rate was observed. This paper attempts to correlate the crack growth rate results with the average inelastic inelastic

Of or relating to the demand for a good or service when quantity purchased varies little in response to price changes in the good or service.
 strain accumulated in a single cycle with the help of FEA (Finite Element Analysis) A mathematical technique for analyzing stress, which breaks down a physical structure into substructures called "finite elements." The finite elements and their interrelationships are converted into equation form and solved mathematically. . The validity of the criteria for choosing the damage volume for different empirical models is also explored. (SMTAI, September 2005)

Authors: Paresh Limaye, Bart Vandevelde, Dirk Vandepitte and Bert Verlinden; paresh.limaye@imec.be.
COPYRIGHT 2005 UP Media Group, Inc.
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2005, Gale Group. All rights reserved. Gale Group is a Thomson Corporation Company.

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Author:Verlinden, Bert
Publication:Circuits Assembly
Date:Sep 1, 2005
Words:219
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