IMPROVED MEASUREMENT SYSTEM FOR INFRARED PROPERTIES OF MATERIALS.NIST (National Institute of Standards & Technology, Washington, DC, www.nist.gov) The standards-defining agency of the U.S. government, formerly the National Bureau of Standards. It is one of three agencies that fall under the Technology Administration (www.technology. has a new instrument to provide enhanced characterization of infrared optical properties of materials. The instrument is currently being used to calibrate To adjust or bring into balance. Scanners, CRTs and similar peripherals may require periodic adjustment. Unlike digital devices, the electronic components within these analog devices may change from their original specification. See color calibration and tweak. gold mirrors for use as reference standards by a manufacturer of reflectance and scattering distribution measurement systems. This work is being done under the auspices of the Optical Properties of Materials Consortium. The Consortium is geared for partners interested in the development of standard reference materials and calibration services to characterize optical properties such as transmittance, reflectance, emittance, and polarization over the wavelength regions of UV to far IR. The instrument uses a precision goniometer goniometer /go·ni·om·e·ter/ (go?ne-om´e-ter) 1. an instrument for measuring angles. 2. a plank that can be tilted at one end to any height, used in testing for labyrinthine disease. and has a Fourier-transform infrared (FTIR FTIR Fourier Transform Infrared (spectroscopy) FTIR Frustrated Total Internal Reflection FTIR Fourier Transfer Ir ) spectrophotometer spectrophotometer, instrument for measuring and comparing the intensities of common spectral lines in the spectra of two different sources of light. See photometry; spectroscope; spectrum. as a source. The system can measure variable angle absolute reflectance and transmittance from 12[degrees] (and 0[degrees]) to [greater than]80[degrees], over the 1 [micro]m to 5[micro]m wavelength range with an expanded (k = 2) uncertainty of 0.002. Improvements to the new measurement system are underway: the wavelength range will be expanded to 20 [micro]m and IR ellipsometry measurement capability will be established. These improvements are expected to improve the accuracy in the determination of IR optical constants of opaque materials. |
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