High-speed SOC tester.93000 SOC series for functional, at-speed tester is for high-pin-count devices (PC chipsets up to 3.6 Gb/s). Digital card offers per-pin scalability from 800 Mb/s to 3.6 Gb/s. Each pin offers both single-ended and differential I/O (Input/Output) The transfer of data between the CPU and a peripheral device. Every transfer is an output from one device and an input to another. See PC input/output. I/O - Input/Output test capabilities to test interfaces including DDR (Double Data Rate) Refers to an SDRAM memory chip that increases performance by doubling the effective data rate of the frontside bus. For more details, see SDRAM. DDR - Double Data Rate Random Access Memory , G-DDR, PCI Express A high-speed peripheral interconnect from Intel introduced in 2002. Note that although sometimes abbreviated "PCX," PCI Express is not the same as "PCI-X" (see PCI-SIG and PCI-X for comparison). As a result of the confusion, "PCI-E" or "PCIe" is the accepted abbreviation. , S-ATA, HyperTransport and Front Side Bus. Differential pin edge placement accuracy of better than [+ or -]30 ps. Up to eight independent clock domains, can satisfy timing needs for concurrent at-speed testing of multiple buses running at non-friendly speed ratios (bus fractions). Agilent Technologies This article needs sources or references that appear in reliable, third-party publications. Alone, primary sources and sources affiliated with the subject of this article are not sufficient for an accurate encyclopedia article. , agilent.com |
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