# Handbook of exponential and related distributions for engineers and scientists.

1584881380

Handbook of exponential and related distributions for engineers and scientists.

Pal, Nabendu et al.

Chapman & Hall/CRC

2006

339 pages

$99.95

Hardcover

QA273

This textbook provides an introduction to positively skewed probability distributions that typically don't receive much attention in other introductory statistics textbooks. Pal (statistics, U. of Louisiana at Lafayette), Jin (statistics, Central Connecticut State U.), and Lim (mathematics, William Patterson U.) begin with brief coverage of the elementary concepts of statistics, providing chapters on probability distributions, statistical inference, decision theory, and computational aspects. They then turn to the positively skewed exponential, gamma, Weibull, and extreme value distributions, discussing, for each: general properties, distribution characterization, estimation of parameters and related interferences, and goodness of fit test. The final chapter considers system reliability, mainly for series and parallel systems.

([c]20062005 Book News, Inc., Portland, OR)

Handbook of exponential and related distributions for engineers and scientists.

Pal, Nabendu et al.

Chapman & Hall/CRC

2006

339 pages

$99.95

Hardcover

QA273

This textbook provides an introduction to positively skewed probability distributions that typically don't receive much attention in other introductory statistics textbooks. Pal (statistics, U. of Louisiana at Lafayette), Jin (statistics, Central Connecticut State U.), and Lim (mathematics, William Patterson U.) begin with brief coverage of the elementary concepts of statistics, providing chapters on probability distributions, statistical inference, decision theory, and computational aspects. They then turn to the positively skewed exponential, gamma, Weibull, and extreme value distributions, discussing, for each: general properties, distribution characterization, estimation of parameters and related interferences, and goodness of fit test. The final chapter considers system reliability, mainly for series and parallel systems.

([c]20062005 Book News, Inc., Portland, OR)

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Publication: | SciTech Book News |
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Article Type: | Book Review |

Date: | Mar 1, 2006 |

Words: | 138 |

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