Global Testing Selects Teradyne IP750EP Image Sensor Test System for Silicon Valley Installation.BOSTON -- Teradyne (NYSE NYSE See: New York Stock Exchange :TER Third version. See bis. ) announced that Global Testing Corporation USA, a subsidiary of Global Testing Corporation Taiwan, a leader in mixed signal and logic IC testing, has standardized on the Teradyne(R) IP750EP test system for image sensor An image sensor is a device that converts a visual image to an electric signal. It is used chiefly in digital cameras and other imaging devices. It is usually an array of charge-coupled devices (CCD) or CMOS sensors such as active-pixel sensors. testing. Installed at GTC's Silicon Valley (Sunnyvale, CA) test development/production center, the system will be used for testing image sensors for digital cameras and camera-equipped mobile phones. The test system is installed in a clean room environment and is available with both handler and prober capability. Paul Yang, President and CEO (1) (Chief Executive Officer) The highest individual in command of an organization. Typically the president of the company, the CEO reports to the Chairman of the Board. , Global Testing Corporation, said, "We are pleased to make Teradyne's IP750EP, the leading system for image sensor testing, available at our Silicon Valley test development center. On top of our best-in-class engineering capabilities and the seamless application support from Teradyne, the total solution of IP750EP lets us offer significantly lower cost-of-test and faster time-to-volume for our customers. With this addition, we now provide a complete image sensor test solution from development (and initial production services) in Silicon Valley to high-volume production in Taiwan." The IP750 series has dominated the image sensor tester market with its superior performance and low-test cost. The IP750 series delivers high throughput and parallel testing capability, broad device coverage for low- to high-speed CCD CCD in full charge-coupled device Semiconductor device in which the individual semiconductor components are connected so that the electrical charge at the output of one device provides the input to the next device. and CMOS (Complementary Metal Oxide Semiconductor) Pronounced "c-moss." The most widely used integrated circuit design. It is found in almost every electronic product from handheld devices to mainframes. , analog and digital capture, and concurrent image sensor and logic testing. In addition, its user-friendly interface with Excel-based IG-XL(TM) software provides shorter program development and easy maintenance. The system provides an integrated internal illuminator illuminator (light box), n a source of light with uniform intensity for viewing radiographs. illuminator the source of light for viewing an object. and external illuminator for a total CCD/CMOS image sensor test solution. "We are honored to receive such high praise for the IP750EP CCD/CMOS image sensor test system from GTC GTC See: Good 'til cancelled order GTC See good-till-canceled order (GTC). ," said Shuzo Kato, Executive Vice President and Japan Division Manager, Teradyne K.K. "This system is completely integrated with the Illuminator to provide a cost-effective, multi-site image testing solution. The IP750 series is continually evolving to meet the future requirements of image sensor advancements, and we want to make sure our customers will be happy with IP750EP for years to come." About IP750EP IP750EP features 100 MHz (MegaHertZ) One million cycles per second. It is used to measure the transmission speed of electronic devices, including channels, buses and the computer's internal clock. A one-megahertz clock (1 MHz) means some number of bits (16, 32, 64, etc. digital test capability for the testing needs of CCD/CMOS image sensor devices. From its CCD device exceeding 10 Megapixels to the digitized pixel capture function required of its CMOS image sensor A CMOS-based chip that records the intensities of light as variable charges similar to a CCD chip. Although initially used in less expensive digital cameras, the quality of CMOS sensors has improved steadily. CMOS sensors have advantages over CCDs. , IP750EP supports maximum test cost reduction with high-speed, multisite parallel testing capability up to 16 in parallel. The system features IG-XL software, the semiconductor ATE industry's first test development suite combining the performance of the latest PC technology and Windows operating system operating system (OS) Software that controls the operation of a computer, directs the input and output of data, keeps track of files, and controls the processing of computer programs. with familiar standard Microsoft Windows(R) productivity tools (Microsoft Excel(R) and Visual Basic) to leverage program development speed. About Global Testing Corporation USA Global Testing Corporation USA (GTC), located in Sunnyvale, CA, is a subsidiary of Global Testing Corporation, a Taiwan-based leader in memory, mixed signal, and logic IC testing. Founded in 1998, GTC provides a wide range of semiconductor test solutions for wafer sorting, laser repair, IC test, test program development, and burn-in. To learn more about GTC, visit http://www.gttw.com.tw. About Teradyne Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment and interconnection systems. The company's products deliver competitive advantage to the world's leading semiconductor, electronics, automotive and network systems companies. In 2004, Teradyne had sales of $1.8 billion, and currently employs about 5900 people worldwide. For more information, visit www.teradyne.com. Teradyne(R) is a registered trademark of Teradyne, Inc. in the US and other countries. All product names are trademarks or registered trademarks of Teradyne, Inc. (including its subsidiaries) or their respective owners. |
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