Free Keithley Web-Based Seminar Explores Electrical Measurements of Photovoltaic/Solar Cell Devices.CLEVELAND -- Keithley Instruments Keithley Instruments (NYSE: KEI) is a measurement and instrument company headquartered in Solon, Ohio. Keithley develops, manufactures, markets and sells highly accurate instruments and data acquisition products, as well as complete system solutions for high-volume production , Inc. (NYSE NYSE See: New York Stock Exchange : KEI), a world leader in advanced electrical test instruments and systems, will offer a free, web-based seminar titled "Photovoltaic The generation of voltage by a material that is exposed to light in the visible and invisible ranges. See photoelectric and photovoltaic cell. Measurements: Testing the Electrical Properties of Today's Solar Cells." It will be broadcast on Thursday, June 18, 2009. This one-hour seminar will provide an overview of the electrical measurements Electrical measurements Measurements of the many quantities by which the behavior of electricity is characterized. Measurements of electrical quantities extend over a wide dynamic range and frequencies ranging from 0 to 1012 Hz. used in photovoltaic device development from basic research to early production testing. To register for this event, visit www.keithley.com/events/semconfs/webseminars. In addition to the underlying theory of how solar cells work, this web-based seminar will focus on the physical measurements required to characterize them, as well as on cell properties that can be inferred from test results. Topics will include both capacitance-voltage (C-V C-V Capacitance-Voltage C-V Schedule V Controlled Substance (USA) ) and current-voltage (I-V I-V Current/Voltage ) characterization, including DC and pulse techniques, as well as common measurements of a cell's efficiency. The event will conclude with a text-based Q&A session. Participants in the seminar will learn about the measurements required to characterize photovoltaic devices, the types of device information electrical characterization can provide, and special system considerations for test labs. Chris Armstrong, an associate marketer at Keithley who is currently focusing on solar cell characterization, will present the seminar. Armstrong holds a B.S. in computer science and engineering from the University of Toledo National recognition In its 125-year history UT has garnered several national accolades. The University’s programs, faculty and facilities have been highlighted in the media, including and has more than eight years of experience in semiconductor device measurements. Registration Information. "Photovoltaic Measurements: Testing the Electrical Properties of Today's Solar Cells" will be broadcast on Thursday, June 18, at 2:00 p.m. EDT EDT abbr. Eastern Daylight Time EDT Eastern Daylight Time EDT n abbr (US) (= Eastern Daylight Time) → hora de verano de Nueva York EDT . The event is free to the public, but participants must register at www.keithley.com/events/semconfs/webseminars in advance. The seminar will also be archived on Keithley's website for those unable to attend the original broadcast. For More Information. For more information on Keithley or any of its test solutions, visit www.keithley.com or contact the company at: < < Telephone: 800-688-9951 < < 440-248-0400 < < FAX: 440-248-6168 < < E-mail: publisher@keithley.com < < Internet: www.keithley.com < < Address: Keithley Instruments, Inc. < < 28775 Aurora Road < < Cleveland, OH 44139-1891 About Keithley Instruments, Inc. With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication fabrication (fab´rikā´sh n the construction or making of a restoration. , and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test. Products and company names listed are trademarks or trade names of their respective companies. |
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