FormFactor Selected by Tera Probe as Strategic Wafer Test Solution Provider; Major Wafer Testing Service Chooses FormFactor KGD Technology Wafer Probe Solution.LIVERMORE, Calif. -- FormFactor, Inc. (Nasdaq:FORM), a leading provider of advanced wafer probe cards A probe card is an interface between an electronic test system and a semiconductor wafer. Its purpose is to provide an electrical path between the test system and the circuits on the wafer, thereby permitting the testing and validation of the circuits at the wafer level, usually , today announced that Tera Probe Inc. has chosen FormFactor as its strategic partner for wafer probe card technology. Tera Probe, a testing service venture formed by Advantest Corporation, Kingston Technology Kingston Technology Co. is an American producer of memory products. It is located in Fountain Valley, California with manufacturing and logistics facilities in the United States, United Kingdom, Ireland, Malaysia, China and Taiwan. , Powertech and Elpida Memory Elpida Memory, Inc. (エルピーダメモリ株式会社 , Japan's leading global supplier of dynamic random access memory Dynamic random access memory (DRAM) is a type of random access memory that stores each bit of data in a separate capacitor within an integrated circuit. Since real capacitors leak charge, the information eventually fades unless the capacitor charge is refreshed periodically. (DRAM), brings together its founders' respective test equipment, assembly and testing services, memory products and wafer technology -- and now FormFactor wafer probe solutions -- to serve Elpida and other semiconductor manufacturers. Shrinking consumer electronics such as cellular phones and mobile devices continue to demand greater performance from smaller system packages and, as a result, device manufacturers face mounting package production costs coupled with the need for more test insertions to assess complex function. A major cost factor in system packages is the time and costs to package and test die that are ultimately identified as "bad." Wafer-level final test prior to packaging verifies known good die (KGD KGD Known Good Die (semiconductor industry) KGD Kaliningrad, Russia - Kaliningrad Airport (Airport Code) KGD King's Gambit Declined (chess) KGD Komitee Für Grundrechte Und Demokratie ), and is emerging as an important strategy for maximizing yield, cutting costs and minimizing revenue loss due to flawed flaw 1 n. 1. An imperfection, often concealed, that impairs soundness: a flaw in the crystal that caused it to shatter. See Synonyms at blemish. 2. components that cause package failure. Tera Probe is adopting KGD test for mobile memory devices targeting the burgeoning consumer electronics memory segment. "FormFactor offers the industry's only comprehensive KGD solution and was clearly the right choice for our wafer probing requirements," said Masahide Ozawa, president, Tera Probe. "Not only does FormFactor share our vision for KGD, its proven products and its commitment to further enhancements of KGD-yielding technology promise the lowest risk for us as we put our strategy into action." FormFactor introduced UPstream, its wafer-level burn-in test solution, at the KGD Packaging and Test Workshop in September. The new product rounds out FormFactor's suite of advanced technology including wafer sort and at-speed test products comprising its total solution for KGD test. "Tera Probe's selection of FormFactor as its strategic supplier underscores the value of our technology innovation and world-class production capabilities," said Joe Bronson, president, FormFactor. "FormFactor solutions will give Tera Probe a crucial advantage in meeting market demand. When it comes to delivery, our use of cutting-edge micro-electro-mechanical systems Micro-electro-mechanical systems (MEMS) Systems that couple micromechanisms with microelectronics. Such systems are also referred to as microsystems, and the coupling of micromechanisms with microelectronics is also termed micromechatronics. (MEMS (MicroElectroMechanical Systems) Tiny mechanical devices that are built onto semiconductor chips and are measured in micrometers. In the research labs since the 1980s, MEMS devices began to materialize as commercial products in the mid-1990s. ) technology and ability to scale production will ensure Tera Probe the support they need to operate as a global test services provider." About FormFactor FormFactor, Inc. (Nasdaq:FORM) is an industry leader in the design, development, manufacture, sale and support of precision, high-performance advanced semiconductor wafer probe cards. The Company's products are based on its proprietary technologies, including its MicroSpring interconnect (1) To attach one device to another. (2) A physical port (plug, socket) or wireless port (transmitter, receiver) used to attach one device to another. technology and design processes, which enable FormFactor to produce wafer probe cards for test applications that require reliability, speed, precision and signal integrity. FormFactor is headquartered in Livermore, California Livermore is a city in Alameda County, California, United States. The population was 80,723 as of January 1, 2007.[2] Livermore is located in the San Francisco Bay Area. Livermore is a "major suburb" of the Bay Area. . For more information, visit the company's web site at www.formfactor.com. Forward-Looking Statements forward-looking statement A projected financial statement based on management expectations. A forward-looking statement involves risks with regard to the accuracy of assumptions underlying the projections. Statements in this press release that are not strictly historical in nature are forward-looking statements within the meaning of the federal securities laws, including statements regarding business momentum, future growth and the performance of our products. These forward-looking statements are based on current information and expectations that are inherently subject to change and involve a number of risks and uncertainties. Actual events or results might differ materially from those in any forward-looking statement due to various factors, including, but not limited to: the demand for known good die; the Company's ability to timely deliver its KGD technology wafer probe card solution; and the Company's continuing ability to drive innovation and its production capabilities. Additional information concerning factors that could cause actual events or results to differ materially from those in any forward-looking statement is contained in the Company's Form 10-Q Form 10-Q See 10-Q. for the period ending September 24, 2005, filed with the Securities and Exchange Commission ("SEC"), and subsequent filings. Copies of filings made by the Company with the SEC are available at http://investors.formfactor.com/edgar.cfm. The Company assumes no obligation to update the information in this press release, to revise any forward-looking statements or to update the reasons actual results could differ materially from those anticipated in forward-looking statements. |
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