FormFactor Announces High-Parallelism Wafer Probe Interface for Credence Kalos 2 Flash Memory Test System.LIVERMORE, Calif. -- FormFactor's Wafer Probe Technology Combines with Kalos 2 to Dramatically Boost Test Throughput FormFactor, Inc. (Nasdaq:FORM), a leading provider of advanced wafer probe cards A probe card is an interface between an electronic test system and a semiconductor wafer. Its purpose is to provide an electrical path between the test system and the circuits on the wafer, thereby permitting the testing and validation of the circuits at the wafer level, usually , and Credence Systems Credence Systems Corporation (NASDAQ: CMOS), is a manufacturer of test and analytical equipment for the global semiconductor industry. Founded in 1978, it is publicly traded on the Nasdaq stock market under the symbol CMOS. Corporation, the industry's leading provider of design-to-test solutions for the global semiconductor industry, today announced that FormFactor has developed the first 72-DUT (device under test) NOR Flash memory wafer probe solution for the Credence Kalos(R) 2 test system. The combination of FormFactor's mission-critical wafer test technology with the Kalos 2's unique parallel test capabilities doubles the previous 36-DUT standard in NOR flash wafer test parallelism An overlapping of processing, input/output (I/O) or both. 1. parallelism - parallel processing. 2. (parallel) parallelism - The maximum number of independent subtasks in a given task at a given point in its execution. E.g. . According to according to prep. 1. As stated or indicated by; on the authority of: according to historians. 2. In keeping with: according to instructions. 3. FormFactor's estimates, this combination can reduce the cost-of-test for 256 Mb NOR Flash devices by as much as 33 percent. Webfeet Research, a Monterey, California-based market analysis firm, forecasts NOR flash bit volumes will grow 59 percent in 2004 and 80 percent in 2005, fueled by strong demand for camera cellular phones and other mobile consumer appliances. The rapid growth in NOR flash production will require manufacturers to significantly increase expensive wafer test capacity, stretching already tight capital budgets. Many NOR flash manufacturers are turning to high-parallelism wafer test solutions to achieve increased test throughput and meet market demand while reducing capital expenditures. Credence's Kalos 2 system with 72 independent sites allows manufacturers to test 72 NOR flash devices in parallel. By leveraging the capabilities of FormFactor's new 72-DUT wafer probe solution, Kalos 2 sets a new standard in wafer test parallelism for NOR flash memory. The new FormFactor solution extends the high-pin-count, large-area-array FormFactor wafer test technology used in the DRAM market to test all pads on 72 DUTs of compatible NOR flash die per touchdown. FormFactor memory wafer probe cards, featuring the company's patented MicroSpring(R) interconnect (1) To attach one device to another. (2) A physical port (plug, socket) or wireless port (transmitter, receiver) used to attach one device to another. technology, support high levels of parallelism and provide high test-cell availability. FormFactor's proprietary MicroSpring interconnect is a key enabler of the company's high parallelism wafer test probe A test probe (test lead, test prod) is a physical device used to connect electronic test equipment to the device under test (DUT). They range from very simple, rugged devices to complex probes that are sophisticated, expensive, and fragile. cards, providing superior accuracy, reliability and signal integrity. "Manufacturers need to reduce costs to meet competitive pricing pressures and gain maximum profitability," said Tom Trexler, Marketing Director, Memory Products, Credence Systems Corporation. "As NOR devices begin to show a slow rise in average selling price The average sales price of goods or commodities. Especially used in the retail sector and technology distribution. , the 72-site Kalos 2 with FormFactor probe technology provides a proven solution for high-throughput NOR test. This combination helps manufacturers turn out more devices, reduce manufacturing costs and maximize profit opportunities in today's market." FormFactor also plans to apply its S200(TM) high-speed probing test technology in probe cards for the Kalos 2 to create a low-cost test solution for fully tested NOR flash die. FormFactor's S200 test technology enables full functional test of NOR flash die on-wafer, ensuring that only functional devices are implemented in expensive multi-chip packages (MCP (1) See Microsoft certification. (2) (MultiChip Package) A chip package that contains two or more chips. It is essentially a multichip module (MCM) that uses a laminated, printed-circuit-board-like substrate (MCM-L) rather than ceramic (MCM-C). ) used in mobile consumer electronics. Only FormFactor can combine high-speed probing technology with high parallelism to probe fully tested die cost effectively. The company is a leader in developing the fully tested die approach in the DRAM market, and is now working with Credence to deliver the benefits to NOR flash manufacturers. "FormFactor partners with leading semiconductor test companies like Credence to solve the industry's most challenging problems, whether it be test throughput, precise fine-pitch probing, or high-speed signaling for fully tested die," said Larry Levy, director of flash product marketing for FormFactor, Inc. "In our strategic engagement with Credence, we leveraged our proven DRAM technology to deliver the cost-of-test benefits of FormFactor wafer probe cards to the flash wafer test market." About Credence Credence Systems Corporation (Nasdaq:CMOS (Complementary Metal Oxide Semiconductor) Pronounced "c-moss." The most widely used integrated circuit design. It is found in almost every electronic product from handheld devices to mainframes. ) is the industry's leading provider of design-to-test solutions for the global semiconductor industry. With a commitment to applying innovative technology to lower the cost-of-test, Credence delivers competitive cost and performance advantages to integrated device manufacturers See IDM. (IDMs), wafer foundries, outsource assembly and test (OSAT OSAT On-Site Assessment and Training OSAT Office for the Study of Automotive Transportation OSAT One Step At a Time (outdoor activity club) OSAT One Step At a Time (George Strait album) ) suppliers and fabless chip companies worldwide. A global, ISO (1) See ISO speed. (2) (International Organization for Standardization, Geneva, Switzerland, www.iso.ch) An organization that sets international standards, founded in 1946. The U.S. member body is ANSI. 9001-certified company with a presence in 20 countries, Credence is headquartered in Milpitas, California Milpitas (IPA pronunciation: mɪlpitʌs; inhabitants are called 'Milpitans') is a city in Santa Clara County, California. It is located with San Jose to its south and Fremont to its north, at the eastern end of Highway 237 and generally between Interstate freeways 680 and . More information is available at http://www.credence.com. About FormFactor FormFactor, Inc. (Nasdaq:FORM) is an industry leader in the design, development, manufacture, sale and support of precision, high-performance advanced semiconductor wafer probe cards. The company's products are based on its proprietary technologies, including its MicroSpring interconnect technology and proprietary design processes, which enable FormFactor to produce wafer probe cards for test applications that require reliability, speed, precision and signal integrity. FormFactor is headquartered in Livermore, California Livermore is a city in Alameda County, California, United States. The population was 80,723 as of January 1, 2007.[2] Livermore is located in the San Francisco Bay Area. Livermore is a "major suburb" of the Bay Area. . For more information, visit the company's web site at www.formfactor.com. FormFactor, MicroSpring and S200 are trademarks of FormFactor, Inc. Forward-Looking Statement forward-looking statement A projected financial statement based on management expectations. A forward-looking statement involves risks with regard to the accuracy of assumptions underlying the projections. Statements in this press release that are not strictly historical in nature are forward-looking statements within the meaning of the federal securities laws. These forward-looking statements are based on current information and expectations that are inherently subject to change and involve a number of risks and uncertainties. Actual events or results might differ materially from those in any forward-looking statement due to various factors, including, but not limited to: the specific test requirements of semiconductor manufacturers, and the performance and market acceptance of FormFactor's new products or technologies. Additional information concerning factors that could cause actual events or results to differ materially from those in any forward-looking statement is contained in FormFactor's report on Form 10-Q Form 10-Q See 10-Q. for the fiscal period ended March 27, 2004, filed with the Securities and Exchange Commission ("SEC"), and subsequent filings. Copies of filings made by FormFactor with the SEC are available at http://investors.formfactor.com/edgar.cfm. FormFactor assumes no obligation to update the information in this press release, to revise any forward-looking statements or to update the reasons actual results could differ materially from those anticipated in forward-looking statements. |
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