FEI and SELA Partner to Provide Advanced TEM Sample Preparation.SANTA CLARA, Calif.--(BUSINESS WIRE)--Aug. 2, 1999-- SELA, a manufacturer of automated SEM and TEM TEM 1. transmission electron microscope. 2. triethylenemelamine. 3. transmissible encephalopathy of mink. sample preparation systems for the semiconductor industry, today announced that it is partnering with FEI Company (Nasdaq: FEIC FEIC Financial Executives International Canada ), a leading supplier of charged particle beam A charged particle beam is a spatially localized group of electrically charged particles that have approximately the same velocity (speed and direction). The kinetic energies of the particles are typically measured in keV or MeV, much larger than the energies of particles at systems, to demonstrate a complete Transmission Electron Microscopy “TEM” redirects here. For other uses, see TEM (disambiguation). Transmission electron microscopy (TEM) is an imaging technique whereby a beam of electrons is transmitted through a specimen, then an image is formed, magnified and directed to appear either (TEM) sample preparation at the Microscopy & Microanalysis microanalysis /mi·cro·anal·y·sis/ (-ah-nal´i-sis) the chemical analysis of minute quantities of material. microanalysis the chemical analysis of minute quantities of material. Expo. The demonstration will team SELA's TEMstation with FEI's focused ion beam Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor and materials science fields for site-specific analysis, deposition, and ablation of materials. The FIB is a scientific instrument that resembles a scanning electron microscope. FIB fib n. An insignificant or childish lie. intr.v. fibbed, fib·bing, fibs To tell a fib. See Synonyms at lie2. 200TEM workstation, creating a leading-edge TEM sample preparation solution that increases productivity and throughput by reducing prep time and increasing the success rate. The partnership comes at a critical moment for the market, as a growing number of chipmakers must outsource samples to contract analytical labs for time-consuming TEM sample preparation and analysis, which introduces substantial costs and lengthens cycle times. In tandem, the tools provide the industry's highest throughput for TEM sample preparation - TEM-ready samples are produced in less than two hours. Fully compatible with the FEI FEI Fédération Équestre Internationale. FIB workstation, automatically packaged samples from SELA's TEMstation can be directly loaded into the FIB in a seamlessly transfer, reducing the possibility of failure during handling. The program to link the sample preparation processes was developed to harness the potential for achieving maximum efficiency, ease-of-use and increased accuracy. Besides the obvious advantages, automation on both the TEMstation and the FIB 200TEM yields reproducible results independent of operator's skills. "Integrating the TEMstation and FIB workstation decreases the time-consuming TEM sample pre-prep and FIB workstation prep," said Efrat Raz, general manager of SELA USA. "The partnership between SELA and FEI provides huge benefits to customers - reduced sample preparation turnaround time (1) In batch processing, the time it takes to receive finished reports after submission of documents or files for processing. In an online environment, turnaround time is the same as response time. , increased throughput and significantly lowers operating and outsourcing costs." The TEMstation is a stand-alone TEM sample preparation system designed to reduce overall TEM preparation time and improve yield. The TEMstation, which is built for cooperative use with SELA's MC Series microcleaving systems for cross-section preparation, produces a TEM sample 20 microns thin in 15 minutes and features the capability to control and program the target location within the width. The FIB 200TEM then finishes the sample in less than 45 minutes. SELA and FEI Company are exhibitors at the Microscopy & Microanalysis Expo 99, being held August 2-5 in Portland, Oregon at the Oregon Convention Center The Oregon Convention Center is a convention center in Portland, Oregon. It is located on the east side of the Willamette River in the Lloyd District neighborhood. The Oregon Convention Center is best known for the twin spire towers which provide light into the building's interior. . ABOUT FEI Company FEI Company is a leading supplier of charged particle beam systems, including FIB systems, DualBeams, scanning electron microscopes, transmission electron microscopes and components for submicron-level imaging, analysis, modification and fabrication. FEI has approximately 1,000 employees worldwide, with manufacturing operations located in Hillsboro, Oregon; Eindhoven, The Netherlands; and Brno, Czech Republic. ABOUT SELA SELA is focused on the development, manufacturing, and marketing of its innovative solutions for sample preparation. SELA pioneered microcleaving technology for cross-section preparation, targeted at Scanning Electron Microscopy (SEM) analysis applications. With the recent addition of the TEMstation, the company has bolstered its microcleaving technology by streamlining the Transmission Electron Microscopy (TEM) sample preparation process. These comprehensive solutions for both SEM and TEM sample preparation support applications in failure analysis, process monitoring and R&D. |
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