Electroglas introduces direct probe sensor for Horizon wafer prober series; machine-vision-based DPS option performs automatic probe-to-pad alignment.

SANTA CLARA, Calif.--(BUSINESS WIRE)--April 18, 1995-- Electroglas Inc. (NASDAQ: EGLS), a leading supplier of automatic wafer probing systems to the global semiconductor industry, today introduced the Direct Probe Sensor (DPS) option for its Horizon 4060X and Horizon 4080X wafer probers.

When incorporated, the fully integrated option completes automatic alignment of test probes to test pads using sophisticated machine vision components and software. Currently in the final phases of beta testing at key customer sites, the DPS minimizes operator involvement in probe-to-pad alignment (PTPA), reducing subjectivity and increasing productivity.

According to Electroglas' Director of Marketing, Phillip Truckle, the new DPS option represents another step toward the goal of total prober automation. "By increasing the level of machine automation and autonomy in these operations, we are providing our customers with a product that will help shorten their time to test while increasing their systems' ease of use," noted Truckle.

Critical to accurate wafer probing, which determines the number of good devices, or die, on a wafer, probe-to-pad alignment involves a series of complex operations -- all of which can be automated through implementing the DPS option. The DPS determines probe tip x, y and z coordinates without directly contacting probes -- its compact camera and lens system inspects only the underside of the probe card.

Operation of the DPS is designed to be simple, with minimal operator interaction required. Using the APTPA Setup routine with DPS, the prober finds x, y and z positions of probe tips; checks for planarity and calculates probe tip location; calculates touchdown location; and performs a touchdown. Next, the probe mark inspection (PMI) feature can be used, and the touchdown position optimized using the probe-to-pad optimization (PTPO) feature.

The DPS factory option is available separately, or as part of the company's Super Unattended Sort Package, which includes DPS, PTPA, PTPO (probe-to-pad optimization) and PMI (probe mark inspection) software. Retrofit kits, including installation service, for both the 4060X and 4080X are also available.

Electroglas reports that it already has a significant backlog of orders for the DPS option. Shipment is scheduled to begin in the third quarter of this year.

About Electroglas: Founded in 1960, Electroglas Inc. is a world-leading supplier of the automated wafer-probing products that semiconductor manufacturers rely on to sort and classify integrated circuits. The company's products position semiconductor devices that are still in wafer form under contact probes to facilitate accurate, rapid, reliable testing, and manage information collected during the testing process. Electroglas' common stock is traded on the Nasdaq Stock Market under the trading symbol EGLS.

CONTACT: MCA Inc.

Lisa Gillette, 415/968-8900