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Electroglas Signs Multiyear Agreement to Provide Wafer Inspection Systems for the Leading Ink-Jet Printer and Cartridge Manufacturer.


Business Editors/High-Tech Writers

SAN JOSE San Jose, city, United States
San Jose (sănəzā`, săn hōzā`), city (1990 pop. 782,248), seat of Santa Clara co., W central Calif.; founded 1777, inc. 1850.
, Calif.--(BUSINESS WIRE)--Nov. 27, 2000

Advanced-Feature QuickSilver quicksilver: see mercury.


(1) (QuickSilver Technology, Inc., San Jose, CA, www.qstech.com) A mobile communications company that specializes in a reconfigurable logic chip for cellphones and PDAs. See adaptive computing.
(TM) and QuickLook(TM)

Inspection Systems to Test Next-generation Ink-jet Cartridge Die

Electroglas, Inc. (Nasdaq:EGLS EGLS Eastside German Language School (Issaquah, WA) ), a leading supplier of process management tools for the semiconductor industry, today announced a multiyear agreement to supply the leading manufacturer of ink-jet printers and cartridges with advanced-feature QuickSilver wafer inspection systems and related QuickLook process-visualization workstations. The customer will use the QuickSilver and QuickLook 9systems to inspect microstructures on die used in the ink cartridges it produces for all its commercial ink-jet printers.

The QuickSilver inspection system will identify and classify surface defects on die and perform metrology on microstructures that meter ink. The QuickLook process-visualization workstation presents several types of maps from each wafer in a lot, coloring defective die according to according to
prep.
1. As stated or indicated by; on the authority of: according to historians.

2. In keeping with: according to instructions.

3.
 their bin codes and graphically revealing the position and type of every defect. Together, QuickSilver and QuickLook achieve engineering-quality metrology data for process management at full production inspection speed.

"Electroglas' QuickSilver and QuickLook products work in tandem Adv. 1. in tandem - one behind the other; "ride tandem on a bicycle built for two"; "riding horses down the path in tandem"
tandem
 to identify and classify defects at full production speed, enabling our customers to achieve world-class yields," said Joe Savarese, general manager of Electroglas Inspection Products. "The evolution of printer technology places exceedingly ex·ceed·ing·ly  
adv.
To an advanced or unusual degree; extremely.


exceedingly
Adverb

very; extremely

Adv. 1.
 demanding requirements on the wafer-level inspection of ink-cartridge die. Electroglas' long relationship with the preeminent pre·em·i·nent or pre-em·i·nent  
adj.
Superior to or notable above all others; outstanding. See Synonyms at dominant, noted.



[Middle English, from Latin prae
 ink-jet printer manufacturer will continue to thrive as we meet the inspection needs for their next generation of ink-jet printers."

For more information about the QuickSilver wafer inspection system and the QuickLook process-visualization workstation, contact Electroglas Inspection Products at 541/738-2200.

About Electroglas, Inc.

Electroglas delivers essential tools for process management designed to enhance semiconductor companies' profitability. The company's wafer probers The introduction to this article provides insufficient context for those unfamiliar with the subject matter.
Please help [ improve the introduction] to meet Wikipedia's layout standards. You can discuss the issue on the talk page.
, inspection systems and software solutions server as data collection, management and analysis tools that semiconductor manufacturers depend upon to improve their productivity and process control by optimizing sort-floor efficiency. Electroglas has been a leading supplier of wafer probers for more than 35 years and has an installed base of more than 10,000 systems.

Note to Editors: The company's stock trades on the NASDAQ National Market under the symbol "EGLS". The company's website is located at www.electroglas.com
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No portion of this article can be reproduced without the express written permission from the copyright holder.
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Date:Nov 27, 2000
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