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Electroglas Introduces the EG6000, the World's Most Accurate 300mm, High-Volume, Production Prober.


SAN JOSE San Jose, city, United States
San Jose (sănəzā`, săn hōzā`), city (1990 pop. 782,248), seat of Santa Clara co., W central Calif.; founded 1777, inc. 1850.
, Calif. -- Electroglas, Inc. (Nasdaq:EGLS EGLS Eastside German Language School (Issaquah, WA) ), a leading supplier of wafer probers and prober-based test handling solutions for the semiconductor industry, today announced the introduction of the EG6000, a 300-mm production wafer prober designed for high-volume manufacturing that fuses advanced automation with the highest caliber of prober technology. The EG6000 is the only 300mm prober that utilizes precision direct-drive technology to achieve the highest accuracy available today. Two versions are available: the base system, with accuracy of +/- 2.5 microns; and the "S" version, with an optional ultra-high accuracy package that increases the accuracy to +/-1.5 microns. The EG6000 also delivers the fastest throughput as measured from lot-start to lot-end and has a very low maintenance design for dependable performance.

"The EG6000 is the new flagship prober for Electroglas, representing a major advancement in prober design, control systems, and automation," said Tim Boyle Tim Boyle (born January 28, 1984) is an Australian rules football player, playing forward with the Hawthorn Hawks of the Australian Football League. His career has been plagued by injuries. , Electroglas CTO (Chief Technical Officer) The executive responsible for the technical direction of an organization. See CIO and salary survey.  and VP of Marketing. "With the EG6000, manufacturers can have the dependable production prober they need that is, at the same time, an advanced system with the highest accuracy and throughput available."

About the EG6000

The EG6000 uses proprietary motion control that yields up to a 30% improvement in stepping time, while virtually eliminating any negative effects on test from typical external stimuli encountered in the production environment.

The EG6000's "one-button" probing automation, combined with improved robustness of critical prober functions, greatly simplifies setup and operation in a high-volume manufacturing environment. Operators can efficiently start probing then walk away while the prober automatically completes all necessary tasks to setup and align the probe card A probe card is an interface between an electronic test system and a semiconductor wafer. Its purpose is to provide an electrical path between the test system and the circuits on the wafer, thereby permitting the testing and validation of the circuits at the wafer level, usually  and wafers. A unique embedded Inserted into. See embedded system.  statistical modeling engine determines prober changes needed due to temperature variations. Adjustments to the probe-to-pad contact position are made, as required, to automate handling of temperature changeover (programming) changeover - The time when a new system has been tested successfully and replaces the old system. . This means that during a temperature change, probing operations can begin immediately after the chuck reaches the set point. The EG6000 does all this with the wafer on the chuck and without alignment tools or operator intervention, providing a significant increase in tester utilization and throughput, which helps customers lower the cost of test.

Intended to be portable, the EG6000 allows customers to easily move the machine and rapidly resume test operations with no recalibration required. This capability permits customers, such as test houses that move machines often, to eliminate costly setup delays.

The EG6000 is designed to handle advanced devices with copper interconnects and low-k dielectrics, and to avoid pad damage or substrate damage that is common when probing these devices. Using a proprietary, ultra-high precision, chuck position sensor A position sensor is any device that enables position measurement. It can either be an absolute position sensor or a relative one(displacement sensor). Position sensors can be either linear or angular.  with 100-nanometer resolution, the new MicroTouch feature allows user-configurable deceleration deceleration /de·cel·er·a·tion/ (de-sel?er-a´shun) decrease in rate or speed.

early deceleration
 of the Z-stage just as the probe pins contact the bond pads, greatly decreasing the impact force. The EG6000 also uses a combination of optical profiling and pin finding with new higher precision algorithms for improved accuracy and robustness. Overall, the EG6000 provides more than twice the Z-accuracy than is available from other prober designs.

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 Bob Fenton, Director of Marketing at Electroglas, "The EG6000 is the best choice for probing advanced 300mm SOC and memory wafers or for the high flexibility needs of test houses and foundries that must regularly run 150mm to 300mm wafers, change temperatures, and move the prober from one tester to another."

About Electroglas

Electroglas is a supplier of innovative probers, prober-based test handlers, test floor management software and services that improve the overall effectiveness of semiconductor manufacturers' wafer and device testing. Headquartered in San Jose, California San Jose (IPA: /ˌsænhoʊˈzeɪ/) is the third-largest city in California, and the tenth-largest in the United States. It is the county seat of Santa Clara County. , the company has been a leading equipment supplier to the semiconductor industry for over four decades, and has an installed base of more than 15,000 systems worldwide. Electroglas' stock trades on the NASDAQ National Market under the symbol "EGLS." More information about the company and its products is available at www.electroglas.com.
COPYRIGHT 2005 Business Wire
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2005, Gale Group. All rights reserved. Gale Group is a Thomson Corporation Company.

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Publication:Business Wire
Geographic Code:1USA
Date:Jan 18, 2005
Words:630
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