Digital Lightwave Announces Advanced Jitter and Wander Testing at PDH Rates.

CLEARWATER, Fla. -- Digital Lightwave(R), Inc. (OTCBB:DIGL), a leading provider of optical networking test equipment and technology, today announced the availability of NIC products equipped with Jitter and Wander test capability on PDH and T-Carrier interfaces. The NIC Plus and NIC EP now support jitter and wander testing at 1.5 Mbps, 2 Mbps, 34 Mbps, 45 Mbps, and 139 Mbps in addition to SONET, SDH, and OTN rates. The first instruments with this capability have already been shipped to international customers.

The Digital Lightwave NIC jitter testing solution utilizes patented Digital Phase Analysis technology originally pioneered in the OTS(TM) (Optical Test System), and newly developed digital technology for truly fast and accurate jitter and wander measurement. In contrast with other instruments that use analog methods of jitter measurement, Digital Lightwave's digital technology enables very accurate measurement and repeatability with unmatched stability. The NIC test instruments using digital technology can perform jitter and wander measurement and generation in a single range with the same accuracy and resolution throughout the entire range.

"Our new capabilities are exactly what the customer is looking for," said Jeff Adams, Senior Sales Support Engineer at Digital Lightwave. "They will now be able to obtain accurate measurements with the speed, stability, repeatability, and accuracy they need."

NIC products equipped with jitter and wander options are used to verify global communications facilities in compliance with the International Telecommunications Union (ITU) O.171/O.172 standards. The NIC can perform intrinsic jitter measurement, jitter tolerance, and jitter transfer tests as well as industry-standard wander analysis. The instrument can also measure and add wander to analog clock signals for timing recovery analysis and timing stress. This capability is unique to the NIC and needed by all Network Element manufacturers.

Jitter and wander testing is vital to detect flaws and inconsistencies in timing systems that would hamper the ability to transport information, especially at high data rates. Jitter can be caused by a number of different sources in the network and the effects are cumulative, leading to a decreased system margin and making the equipment more susceptible to errors. Wander relates to clock stability and is an important consideration in synchronous networks. Applications for jitter and wander testing include equipment design, manufacturing test, field implementation and maintenance, covering the full customer base of NIC products.

About the NIC

Digital Lightwave's portable Network Information Computers (NIC) are software-based, modular products that combine a multitude of test functions in a single integrated solution, including OTN, SONET/SDH, NextGen (VCAT, LCAS, GFP), T-carrier/PDH, ATM, Ethernet 10/100/1000M, 1GigE and 10GigE LAN/WAN, and Jitter/Wander analysis.

About Digital Lightwave

Digital Lightwave, Inc. provides the global communications networking industry with products, technology and services that enable the efficient development, deployment and management of high-performance networks. Digital Lightwave's customers rely on its offerings to optimize network performance and ensure service reliability.

Editor's Note: Digital Lightwave(R), OTS(TM), NIC(R), NIC Plus(R), and NIC Plus(R) are trademarks or registered trademarks of Digital Lightwave, Inc.