Correcting name, words, in release regarding LogicVision's BIST research that ran Sept. 19, 1995.--(BUSINESS WIRE)-- In BW200-9/19, New contracts boost LogicVision's BIST BIST - Built-in Self Test research awards to $3.7 million, there is a misspelling mis·spell·ing n. 1. The act or an instance of spelling incorrectly. 2. A word spelled incorrectly. Noun 1. in a name in the third graph. The third graph, sixth line should read xxx Paul Ratazzi (sted Paul Rapazzi). The seventh graph, sixth line should read xxx integrated an hierarchical feature (sted integrated and hierarchical xxx). The ninth graph, fourth line should read xxx test approaches use (sted test approaches are). The corrected release follows: -0- New contracts boost LogicVision's BIST research awards to $3.7 million; awards offer further evidence of company's leadership position in Built-In Self-Test technology Business Editors/Computer Writers SAN JOSE, Calif.--(BUSINESS WIRE)--Sept. 19, 1995--Building on an already productive relationship, LogicVision today announced that it was awarded two significant federal contracts to perform advanced research and development in the areas of fault modeling for analog and mixed-signal circuits, and the integration of Design-For-Test (DFT DFT - discrete Fourier transform ) capabilities on multichip modules (MCMs) and printed circuit boards (PCBs). These announcements, coupled with the federal RASSP RASSP Rapid Prototyping of Applications-Specific Signal Processing contract awarded to LogicVision in 1994 ($2.3M), brings the total federal contracts awarded to $3.7M, and establishes LogicVision as the clear technology leader in Built-In Self-Test (BIST). The first of the two contracts, Fault Modeling Technology for Analog Circuits, was awarded through a United States Air Force United States Air Force (USAF) Major component of the U.S. military organization, with primary responsibility for air warfare, air defense, and military space research. It also provides air services in coordination with the other military branches. U.S. (USAF) Broad Agency Announcement (BAA) in August of this year. The amount of the award was $608K, with the mission to develop a methodology for automatic, fault-based test generation for complex analog and mixed-signal circuits. Paul Ratazzi, technical director, Rome Air Force Laboratory/ERDA (Electromagnetic & Reliability Directorate), Griffiss Air Force Base Griffiss Air Force Base was a U.S. Air Force base in Rome, New York. Ground was broken on August 2, 1941 for the Rome Air Depot, to be completed in 1942. After a series of names and realignments, the base was finally named Griffiss Air Force Base in 1948. The base is named for Lt. , is responsible for monitoring the BAA award. Results of the research product are due Q4, 1997. The second of the two contracts, Integrated Diagnostics for Multi-Chip Module Technologies, was awarded through a United States Army United States Army Major branch of the U.S. military forces, charged with preserving peace and security and defending the nation. The first regular U.S. fighting force, the Continental Army, was organized by the Continental Congress on June 14, 1775, to supplement local (USA) Small Business Innovative Research (SBIR SBIR Small Business Innovation Research (program/grant) SBIR Space Based Infra-Red SBIR Speaker-Boundary Interference SBIR Site Backsurface-referenced Ideal Plane/Range (silicon wafers) ) program. Each SBIR solicitation is comprised of three award stages, or "Phases," with the completion and consideration of a Phase required before approval of the next Phase. Phase I awards are designed to determine the scientific or technical merit and feasibility of submitted ideas. LogicVision was awarded a Phase I contract in the amount of $53.7K for the SBIR program in May, 1994. Phase I was completed and delivered in December, 1994. This month, LogicVision was subsequently awarded a Phase II contract in the amount of $748K to develop an Electronic Design Automation (EDA (1) (Electronic Design Automation) Using the computer to design, lay out, verify and simulate the performance of electronic circuits on a chip or printed circuit board. ) software technology to aid in the automation of hierarchical integration of DFT capabilities into the MCM (MultiChip Module or MicroChip Module) A chip package that contains several bare chips mounted close together on a substrate (base) of some kind. , PCB PCB: see polychlorinated biphenyl. PCB in full polychlorinated biphenyl Any of a class of highly stable organic compounds prepared by the reaction of chlorine with biphenyl, a two-ring compound. and Integrated Circuit (IC) levels. Christopher Flynn, Technical Director at the Rome Laboratory/ERDA, Griffiss Air Force Base, is responsible for the monitoring of this award. The Phase II contract requires the production of commercial technology. "Since its inception, LogicVision has committed itself to providing chip through system level testability based on Built-In Self-Test technology," stated Dr. Vinod Agarwal, president and founder. "These federal agencies have recognized LogicVision as the only commercial entity providing this level of BIST expertise and we are grateful for their confidence in making these awards," he concluded. LogicVision was previously awarded a $2.3 million contract last year under the Advanced Research Project Agency (ARPA ARPA - Defense Advanced Research Projects Agency )/Tri-Services Rapid Prototyping of Application Specific Signal Processors (RASSP) program. The scope of that contract is to develop a pragmatic scheme and associated CAD tools to make Built-In Self-Test (BIST) an autonomous, integrated and hierarchical feature for electronic systems, particularly Digital Signal Processors (DSP (1) (Digital Signal Processor) A special-purpose CPU used for digital signal processing applications (see definition #2 below). It provides ultra-fast instruction sequences, such as shift and add, and multiply and add, which are commonly used in math-intensive ). LogicVision was selected in the competitive selection process due to their acknowledged expertise in BIST and ability to meet all terms of the agreement. RASSP is a $150 million government investment in technology aimed at developing embedded DSP subsystems faster, better, and at lower cost. The goal of the overall RASSP program is to dramatically improve the process by which complex digital systems, particularly embedded signal processors, are specified, designed, documented, manufactured, and supported. LogicVision was chosen as the sole provider of BIST technology for the entire RASSP program. Dr. John Hines, Chief Design Branch, Microelectronics Division, of the Air Force Wright Laboratory's Solid State Electronics Directorate is responsible for monitoring of the RASSP tech-base programs. Built-In Self-Test (BIST) represents a fundamental paradigm shift in the way that integrated circuits (ICs), printed circuit boards (PCBs), multichip modules (MCMs), and entire systems are tested. Whereas current test approaches use expensive, centralized, external testers ("ATE") to perform testing, BIST adds circuitry to the device, module or board to allow it to test itself. Unlike conventional test methodologies, BIST utilizes a distributed, hierarchical testing approach that actually embeds "testers" within the system being tested and supports full "at-speed" test. LogicVision's ultimate goal is BIST at the systems level, or Electronic Systems Test Automation (ESTA ESTA Electronic System for Travel Authorization (Department of Homeland Security) ESTA Entertainment Services and Technology Association ESTA Energy Systems Trade Association ESTA European Security Transport Association ). ESTA represents the next evolutionary stage of manufacturing test and test automation methodology, whereby entire systems are completely self-testing. LogicVision currently offers its ICBIST technology for automating BIST for embedded memories, logic, and JTAG (Joint Test Action Group) An IEEE standard for boundary scan technology. See scan technology. JTAG - Joint Test Action Group (1149.1) support during the front-end design process. ICBIST inserts the necessary structures at the RTL-level (in Verilog or VHDL (VHSIC Hardware Description Language) A hardware description language (HDL) used to design electronic systems at the component, board and system level. VHDL allows models to be developed at a very high level of abstraction. ) which are then synthesized along with the rest of the design. Using ICBIST, an entire integrated circuit may be made self-testing. LogicVision was founded by Dr. Vinod Agarwal, president & CEO (1) (Chief Executive Officer) The highest individual in command of an organization. Typically the president of the company, the CEO reports to the Chairman of the Board. , with the mission to become the industry leader in supplying BIST technology to the electronics industry. With his extensive research and engineering qualifications, Dr. Agarwal is recognized as a worldwide expert in the field of digital test. The company's technology team has over 80 collective man-years of experience in the research and practical application of Built-In Self-Test (BIST) technology. For more information on LogicVision, please contact Robert P. Smith, VP of Marketing and Business Development, LogicVision, Inc., 1735 N. First Street, Suite 306, San Jose, CA 95112; Telephone: 408/453-0146, fax 408/453-0150. -0- Note to Editors: LogicVision is a registered trademark of LV Software, Inc. CONTACT: LogicVision Robert P. Smith, 408/453-0146 or Interim Communications Michael Zeglin, 408/287-7980 mzeglin@interim.com |
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