Corelis Introduces High-Performance Boundary-Scan - JTAG - Test Support for Semiconductor, SOC and ASIC Testers.

CERRITOS, Calif. -- WGL Remote Diagnostics 1.0 Extends Corelis' High-Performance Boundary-Scan Testing to Semiconductor Testers

Corelis, Inc. today introduced the test industry's first boundary-scan (JTAG) tools that enable customers to port boundary-scan tests to semiconductor testers and remotely diagnose test results on a networked PC. WGL (Waveform Generation Language) Remote Diagnostics 1.0 enables users to review and diagnose boundary-scan test results downloaded from a standalone chip tester on a remote PC, thereby reducing costly usage fees on expensive testers. Using Corelis' WGL Remote Diagnostic 1.0 software, high performance boundary-scan test vectors developed with Corelis' ScanExpressTPG Automatic Test Pattern Generator can be ported to, and executed on, third party IC test platforms such as semiconductor testers, SOC and ASIC testers and functional testers.

WGL Remote Diagnostics 1.0 reduces the high cost to users of operating expensive chip testers by diagnosing boundary-scan faults off-line on a remote PC. This product was designed to meet the needs of engineers designing complex multi-chip modules (MCM) who use the WGL format to run test vectors on the Agilent 83K, Agilent 93K and other testers as well as engineers who use semiconductor testers to qualify boundary-scan compatible devices.

"Our WGL Remote Diagnostics 1.0 minimizes expensive semiconductor tester use time while providing essential boundary-scan test results in the user-friendly format similar to our industry-leading ScanPlus Runner product," said Carmy Yellin, Vice President of Technology for Corelis. "Our boundary-scan tests are easy to produce and are widely accepted by many customers who also develop their own ASICs. Running boundary-scan tests in conjunction with the native tests of a semiconductor tester provide a new level of diagnostic visibility to our customers."

Additional features of WGL Remote Diagnostics 1.0 include the ability to edit test vectors which are otherwise inaccessible to the user as well as the ability to perform custom boundary-scan operations and simulate abnormal waveform situations. Also, WGL Remote Diagnostics 1.0 provides engineers a way to diagnose difficulties with non-conforming devices, fix them and successfully scan them using edited test vectors.

The WGL Remote Diagnostics v1.0 CD-ROM is now available for customer installation and is compatible with the Corelis ScanPlusTPG and ScanExpressTPG boundary-scan test generation tools.

Corelis Inc. offers a broad line of boundary-scan software and hardware products that combine exceptional ease-of-use with advanced technical innovation. Corelis' ScanPlus and ScanExpress Boundary-Scan systems are used for interconnect testing as well as in-system programming of Flash memories, CPLDs and FPGAs. Corelis' systems include a complete range of IEEE-1149.1-compatible boundary-scan testers for PCI, PC-Card, 10/100 LAN, USB 2.0, cPCI/cPXI, PC Card and VXI host interfaces. Corelis also offers a full-line of JTAG emulation and debugging tools. Corelis provides custom test engineering services and is well known for its outstanding customer support.