Cascade Microtech to Announce First Quarter Results.BEAVERTON, Ore. -- Cascade Microtech, Inc. (NASDAQ NASDAQ in full National Association of Securities Dealers Automated Quotations U.S. market for over-the-counter securities. Established in 1971 by the National Association of Securities Dealers (NASD), NASDAQ is an automated quotation system that reports on :CSCD CSCD Community Supervision & Corrections Department (Harris County, Texas) CSCD Cascade & Columbia River Railroad CSCD CTAS Software Change Document CSCD Coupling-Strength-Control Defect ) will release financial results for its first quarter ended March 31, 2005 at approximately 4 p.m. EST, on Tuesday, April 26, 2005. The company will host a conference call beginning at 5 p.m. EST (2 p.m. PST PST Paroxysmal supraventricular tachycardia, see there ) that same afternoon to discuss these results. A simultaneous audio cast of the conference call may be accessed online from the investor relations Investor relations The process by which the corporation communicates with its investors. page of www.cascademicrotech.com. A replay will be available after 7 p.m. EST at this same internet address There are two kinds of addresses that are widely used on the Internet. One is a person's e-mail address, and the other is the address of a Web site, which is known as a URL. Following is an explanation of Internet e-mail addresses only. For more on URLs, see URL and Internet domain name. . (For a telephone replay (available after 7 p.m. EST) dial 888-286-8010 Pass code: 67385934; International: 617-801-6888.) Cascade Microtech designs, develops and manufactures advanced wafer probing solutions for the electrical measurement and test of integrated circuits, or ICs. Cascade's engineering probe stations and analytical probes are used in research and development to perform precise electrical measurements on increasingly complex and high speed ICs. Cascade's production probe cards reduce manufacturing costs of complex and high speed ICs by identifying defective ICs early in the process and by testing multiple ICs concurrently. |
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