Printer Friendly
The Free Library
14,679,288 articles and books
Member login
User name  
Password 
 
Join us Forgot password?

Cadence Brings Timing to the Manufacturing Floor; Cadence Encounter Test Delivers True-Time Delay Test for Nanometer Design.


Business Editors/High-Tech Writers

SAN JOSE San Jose, city, United States
San Jose (sănəzā`, săn hōzā`), city (1990 pop. 782,248), seat of Santa Clara co., W central Calif.; founded 1777, inc. 1850.
, Calif.--(BUSINESS WIRE)--May 18, 2004

Cadence Design Systems (company) Cadence Design Systems - A company that sells electronic design automation software and services.

http://cadence.com/.

See also Verilog.
, Inc. (NYSE NYSE

See: New York Stock Exchange
:CDN (Content Delivery Network) A system of distributed content on a large intranet or the public Internet in which copies of content are replicated and cached throughout the network. ) today announced that it has brought timing to the manufacturing floor with True-Time delay test for processes at 130 nanometers and below. This addition to Cadence(R) Encounter(TM) Test helps ensure the highest Quality-of-Silicon (QoS) by detecting subtle IC defects. In conjunction with this announcement, Artisan Components has become one of the first design chain partners to announce True-Time certification of its 90-nanometer standard cell libraries.

True-Time detects subtle delay defects such as resistive resistive /re·sis·tive/ (re-zis´tiv) pertaining to or characterized by resistance.  opens that can cause catastrophic failures in the end-product application. With the addition of True-Time, Encounter Test is the first and only tool that uses actual standard delay format (SDF (Standard Data Format) A simple file format that uses fixed length fields. It is commonly used to transfer data between different programs.

SDF Pat Smith 5 E. 12 St. Rye NY Bob Jones 200 W. Main St. Palo Alto CA Comma delimited "Pat Smith","5 E.
) timing information from the design process to create timing-accurate delay tests. By tightly controlling the timing of each test using True-Time, Encounter Test automatically maximizes the quality and effectiveness of the test for a given test coverage.

"We have worked very closely with Cadence as it developed True-Time," said Garry Hughes, vice president, ASIC (Application Specific Integrated Circuit) Pronounced "a-sick." A chip that is custom designed for a specific application rather than a general-purpose chip such as a microprocessor.  development and worldwide design centers, IBM (International Business Machines Corporation, Armonk, NY, www.ibm.com) The world's largest computer company. IBM's product lines include the S/390 mainframes (zSeries), AS/400 midrange business systems (iSeries), RS/6000 workstations and servers (pSeries), Intel-based servers (xSeries)  Systems & Technology Group. "With Encounter Test, we have been able to achieve transition fault coverage greater than 90 percent with automated calculation of tester timings. This is in addition to our existing 99 percent stuck-at fault A Stuck-at fault is a particular fault model used by fault simulators and Automatic test pattern generation (ATPG) tools to mimic a manufacturing defect within an integrated circuit. Individual signals and pins are assumed to be stuck at Logical '1', '0' and 'X'.  coverage capability. We have seen shipped product quality improve by up to 2X. As a result, our goal is to use True-Time for all ASIC devices at 130 nanometers and below."

Encounter Test Design Edition uses True-Time delay test to detect the complex defects that become dominant in nanometer-scale designs. Encounter Test Manufacturing Edition provides world-class diagnostics for all detectable defects - including those discovered with True-Time. With a customer proven 80 percent callout accuracy, Manufacturing Edition accelerates the yield ramp goals of manufacturers.

As is the case with the IBM ASIC libraries, Artisan libraries have been certified for True-Time. With certified Artisan libraries, designers can be confident that all of the timing information required to generate True-Time delay tests is readily available and fully verified.

"As a leading semiconductor IP provider, Artisan believes that True-Time certified libraries can help designers reach silicon success," said Neal Carney, vice president of marketing at Artisan. "We believe that these libraries, when coupled with Encounter Test, will help provide an advantage to our customers."

"True-Time delay test provides Encounter Test customers the highest quality-of-test available in the industry," said Paul Estrada, general manager of Encounter Test for Cadence Design Systems. "We are delighted to continue the track record our development team has of delivering high-value test innovations."

True-Time is available immediately as part of the Encounter Test Design Edition ATPG ATPG Automatic Test Pattern Generation
ATPG Automatic Test Program Generator
 Plus option.

About Cadence

Cadence is the largest supplier of electronic design technologies and engineering services. Cadence solutions are used to accelerate and manage the design of semiconductors, computer systems, networking and telecommunications equipment, consumer electronics, and a variety of other electronics-based products. With approximately 4,800 employees and 2003 revenues of approximately $1.1 billion, Cadence has sales offices, design centers, and research facilities around the world. The company is headquartered in San Jose, Calif., and traded on the New York Stock Exchange New York Stock Exchange (NYSE)

World's largest marketplace for securities. The exchange began as an informal meeting of 24 men in 1792 on what is now Wall Street in New York City.
 under the symbol CDN. More information about the company, its products and services is available at www.cadence.com.

Cadence and the Cadence logo are registered trademarks and Encounter is a trademark of Cadence Design Systems, Inc. All other trademarks are the property of their respective owners.
COPYRIGHT 2004 Business Wire
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2004, Gale Group. All rights reserved. Gale Group is a Thomson Corporation Company.

 Reader Opinion

Title:

Comment:



 

Article Details
Printer friendly Cite/link Email Feedback
Publication:Business Wire
Geographic Code:1USA
Date:May 18, 2004
Words:576
Previous Article:National Scientific Corporation's Wi-Fi Tracker Technology under Evaluation by NASA to Bolster Its Space Exploration Program.
Next Article:Air-Q Wi-Fi Signs Definitive Agreement to Acquire Tulsa Wi-Fi Provider.
Topics:



Related Articles
Cadence Introduces Industry's First Yield Diagnostics Tool; Encounter Test Pinpoints Most Critical Design-Related Yield Issues.
Toshiba Implements Its Largest Semiconductor Design to Date with Cadence Digital IC Flow.
Cadence Delivers 50% Power Savings in Latest STARC Production Flow; STARCAD-21 First Production Flow Based on Cadence Encounter 4.2 Digital IC Design...
Cadence Supports TSMC Reference Flow 6.0 to Accelerate 65-Nanometer Design.
Cadence Supports STARC Technology to Improve Delay Test Quality; Top Japanese Research Center's Quality Model Validates Superior Coverage of Cadence...
Kawasaki Micro Maximizes Delay Test Coverage with Latest Cadence Technology; Encounter True-Time Now Delivers Faster-Than-at-Speed Delay Test for...
Teradyne and Cadence Address Improved Test and Diagnostic Flow for Nanometer Devices.
VIA Tapes Out 90-Nanometer Designs with Cadence Encounter Digital IC Design Platform; VIA Tapes Out One of the Region's First 90-Nanometer Designs...
Test Insight Addresses Improved Design-for-Test Flow with Cadence; Integrated Test Flow Uses Cadence Design Data to Debug Test Programs before...
Advantest, Cadence to Collaborate on Zero-Defect Testing Requirements for Automotive Electronics.

Terms of use | Copyright © 2009 Farlex, Inc. | Feedback | For webmasters | Submit articles