Asylum Research Files Counterclaims in Veeco Patent Suit.Business Editors SANTA BARBARA Santa Barbara (săn'tə bär`brə, –bərə), city (1990 pop. 85,571), seat of Santa Barbara co., S Calif., on the Pacific Ocean; inc. 1850. , Calif.--(BUSINESS WIRE)--Jan. 26, 2004 Asylum Research, a manufacturer of atomic force microscopes atomic force microscope (AFM), device that uses a spring-mounted probe to image individual atoms on the surface of a material. Unlike the scanning tunneling microscope, which is also a scanning probe microscope, the AFM can be used on materials that do not conduct (AFMs), today filed counterclaims against Veeco Instruments (Nasdaq: VECO VECO Vernier Engine Cut Off ) in the patent lawsuit initiated by Veeco last September. Asylum Research also denied that its MFP-3D(TM) AFM (Atomic Force Microscope) A device used to image materials at the atomic level. AFMs are used to solve processing and materials problems in electronics, telecom, biology and other high-tech industries. infringes the Veeco patents and contended that the patents are invalid because, among other reasons, Veeco practiced fraud on the US Patent Office. "We are counterclaiming for infringement of a patent that we license from the University of California The University of California has a combined student body of more than 191,000 students, over 1,340,000 living alumni, and a combined systemwide and campus endowment of just over $7.3 billion (8th largest in the United States). and that I am an inventor on which will permit the MFP-3D AFM to operate faster," said Dr. Jason Cleveland, Asylum Research's Chairman. "We are also suing Veeco for not continuing to pay the royalties they owe us for developing a hardware and software module that permits Veeco AFMs to operate more accurately, and is an integral part of their newest AFM controller, the NanoScope(R) IV. Overall, we believe the Veeco lawsuit is an attempt to stop competition and deprive the AFM market of leading edge products." Asylum Research manufactures advanced scientific instrumentation, including AFMs/Scanning Probe Microscopes (SPMs), for nanoscale At nanometer size. Any device only a few nanometers in size is nanoscale. See nanotechnology and nanometer. science and technology. (An AFM/SPM is one of the premier instruments used for measuring surfaces and surface properties at the nanometer level). For additional information, please contact Terry Mehr, Director of Marketing, Asylum Research, 341 Bollay, Santa Barbara, CA 93117, 805-685-7077, terry@AsylumResearch.com. |
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