Applied Materials Wins Semiconductor International Magazine's Best Product Award for SEMVision G2 FIB.SANTA CLARA Santa Clara, city, Cuba Santa Clara (sän`tä klä`rä), city (1994 est. pop. 217,000), capital of Villa Clara prov., central Cuba. , Calif. -- Applied Materials, Inc. today announced that it is a recipient of Semiconductor International magazine's prestigious Editors' Choice Best Product Award for its Applied SEMVision(TM) G2 FIB fib n. An insignificant or childish lie. intr.v. fibbed, fib·bing, fibs To tell a fib. See Synonyms at lie2. system. The system revolutionized critical in-line defect root cause analysis by combining the industry's leading DR-SEM* system with on-board automated FIB* cross-sectioning capability that enabled chipmakers to review and physically analyze defects with a single production-line system. "Continued advances in semiconductor technology have reshaped the world, and our Editor's Choice Product Awards program honors those products that have made those advances possible," said Pete Singer, Editor-in-Chief of Semiconductor International. "These products embody the very best of innovations on which chip makers rely to make their products smaller, faster, cheaper and more reliable. We congratulate the people and the companies that have had the insight and fortitude to bring these innovative products to the market." "Receiving SI's Best Product award affirms the valuable contribution that the Applied SEMVision G2 FIB system has made to accelerate our customers' yield learning and production ramps," said Dr. Gilad Almogy, vice president and general manager of Applied Materials' Process Diagnostics and Control group. "The SEMVision G2 FIB provides breakthrough technologies that help solve critical bottlenecks in the fab. These systems have already been installed in virtually all advanced fabs worldwide, including 65nm-generation facilities." With its patented ClearCut(TM) one-stop review and analysis technology, combining SEM, FIB and EDX EDX Energy Dispersive X-Ray (Spectroscopy) EDX Electronic Data Exchange EDX Extended Data Register EDX Event-Driven Executive (IBM Series/1 OS) EDX Event-Based Data Exchange (UPNet) (energy dispersive dispersive /dis·per·sive/ (-per´siv) 1. tending to become dispersed. 2. promoting dispersion. x-ray) capabilities on a single platform, the Applied SEMVision G2 FIB system offers full defect characterization that can identify the root cause quickly in order to prevent or minimize production defects. By performing high-speed, high-resolution automatic SEM review followed by FIB analysis of defects in just minutes, chipmakers can integrate this capability as part of their in-line review scheme. This unique capability enables a major step forward in production efficiency, yield and fab profitability. Applied Materials (Nasdaq:AMAT AMAT Applied Materials (stock symbol) AMAT Average Memory Access Time AMAT Automatic Message Accounting Transmitter AMAT Anti-Materiel (bomb or mine) AMAT Ageing Management Assessment Team ), headquartered in Santa Clara, California Santa Clara, California (IPA: /ˌsæntəˈklærə/) , founded in 1777 and incorporated in 1852, is a city in Santa Clara County, in the U.S. state of California. , is the largest supplier of equipment and services to the global semiconductor industry. Applied Materials' web site is www.appliedmaterials.com. Note(*): DR-SEM = defect review scanning electron microscope scan·ning electron microscope n. Abbr. SEM An electron microscope that forms a three-dimensional image on a cathode-ray tube by moving a beam of focused electrons across an object and reading both the electrons scattered by the object and ; FIB = focused ion beam Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor and materials science fields for site-specific analysis, deposition, and ablation of materials. The FIB is a scientific instrument that resembles a scanning electron microscope. |
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