Printer Friendly
The Free Library
19,604,530 articles and books
Member login
User name  
Password 
 
Join us Forgot password?

Applied Materials Takes the Lead in Helping Boost Fab Efficiency with Breakthrough Metrology and Inspection Systems.


Business Editors/High-Tech Writers

SANTA CLARA Santa Clara, city, Cuba
Santa Clara (sän`tä klä`rä), city (1994 est. pop. 217,000), capital of Villa Clara prov., central Cuba.
, Calif.--(BUSINESS WIRE)--June 19, 2000

Line of Process Diagnostics and Control Products

Sets Industry Benchmark for Technology Innovation

Applied Materials Applied Materials, Inc. NASDAQ: AMAT (HKSE: 4336 ) is the global leader in nanomanufacturing technology solutions with a broad portfolio of innovative equipment, service and software products for the fabrication of semiconductor chips, flat panel solar displays, solar , Inc. (Nasdaq:AMAT AMAT Applied Materials (stock symbol)
AMAT Average Memory Access Time
AMAT Automatic Message Accounting Transmitter
AMAT Anti-Materiel (bomb or mine)
AMAT Ageing Management Assessment Team
) is taking the lead in developing breakthrough products to increase the efficiency and productivity of customers' fabs. In less than four years, Applied Materials has brought leading-edge metrology metrology

Science of measurement. Measuring a quantity means establishing its ratio to another fixed quantity of the same kind, known as the unit of that kind of quantity.
 and inspection systems to the market with innovative technologies that set a benchmark for other systems. These systems, all technology firsts, include the VeraSEM(TM) 3D metrology system, the SEMVision(TM) defect review system and the new Compass(TM) and Excite(TM) inspection systems being announced today.

"As chip geometries get tighter and the smallest defects become more critical, the importance of process analysis and feedback in the fab is increasing," said Dr. Dan Maydan, president of Applied Materials. "Our latest automated au·to·mate  
v. au·to·mat·ed, au·to·mat·ing, au·to·mates

v.tr.
1. To convert to automatic operation: automate a factory.

2.
 metrology and inspection systems go far beyond standard monitoring tools to offer new capabilities that can significantly expand the role of process diagnostics in contributing to a fab's profitability. We are seeing a major change in this market as many customers adopt our innovative technologies to improve yields and equipment productivity."

Applied Materials has introduced several technology firsts to help customers realize higher yields on their most advanced chip designs. These breakthroughs include the SEMVision, the first automated defect review SEM (scanning electron microscope scan·ning electron microscope
n. Abbr. SEM
An electron microscope that forms a three-dimensional image on a cathode-ray tube by moving a beam of focused electrons across an object and reading both the electrons scattered by the object and
) system for production line use. The SEMVision system is used in all 20 of the world's leading fabs to provide real-time feedback on the source of wafer (1) A small, thin continuous-loop magnetic tape cartridge that has been used from time to time for data storage and specialized applications.

(2) The base unit of chip making. It is a slice taken from a salami-like silicon crystal ingot up to 12" (300mm) in diameter.
 defects. Another milestone innovation is in-line three dimensional imaging technology provided by the VeraSEM 3D for critical dimension (CD) measurement and slope control. This capability enables the system to surpass traditional CD-SEM CD-SEM Critical Dimension - Scanning Electron Microscopy  solutions to offer additional profile information of advanced structures.

The new Compass system introduces high speed and high sensitivity to wafer inspection for increased fab production efficiency. The new Excite process tool monitor delivers the earliest detection of process tool excursions for significant cost savings in yield and productivity.

"Applied Materials has constantly pushed the limits of new inspection and metrology technology to support the continually increasing complex process requirements and advanced structures of future devices," said Gino Addiego, president of Applied Materials' Process Diagnostics and Control Group. "Leveraging our diagnostics capabilities with our process expertise gives us the unique advantage of being able to optimize process tool efficiency. The next step in our strategy to provide continuous improvement and innovation will be to integrate some of these technologies directly with our process equipment to enable even greater tool efficiency and productivity."

Applied Materials, Inc. is a Fortune 500 global growth company and the world's largest supplier of wafer fabrication Wafer Fabrication is a procedure composed of many repeated sequential processes to produce complete electrical or photonic circuits. Examples include production of radio frequency (RF) amplifiers, LEDs, optical computer components, and CPUs for computers.  systems and services to the global semiconductor industry. Applied Materials is traded on the Nasdaq National Market System under the symbol "AMAT." Applied Materials' web site is http://www.appliedmaterials.com.
COPYRIGHT 2000 Business Wire
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2000, Gale Group. All rights reserved. Gale Group is a Thomson Corporation Company.

 Reader Opinion

Title:

Comment:



 

Article Details
Printer friendly Cite/link Email Feedback
Publication:Business Wire
Geographic Code:1USA
Date:Jun 19, 2000
Words:474
Previous Article:Flexpoint and Delphi Automotive Systems Agree on Funding.
Next Article:eHospital, Inc. Announces Board of Advisors; Intel e-Health Veteran, Leading Hi-Tech CEO, and Doctor of Medicine Join Board of Advisors of Privately...
Topics:



Related Articles
Applied Materials Introduces Integrated Metrology on High Productivity Producer CVD System.
New Fab Efficiency Technologies Provide Breakthrough Capabilities for Applied Materials Systems.
Applied Materials Launches 300mm CMP Product Line; Reflexion System Provides Enabling Factory Efficient Solutions for Five Major CMP Applications.
SPARESOLUTIONS USES WEB TECHNOLOGY TO IMPROVE RESPONSE TIME.
Nanometrics intros wireless version of NanoNet.
IDT Orders Applied Materials' NanoSEM 3D Metrology System.
STMicro gets decent results on applied materials' copper CMP system.
Applied Materials Leads the Semiconductor Equipment Industry in the 65nm Revolution.
AMD Orders Applied Materials Systems to Equip 300mm Fab.
Applied Materials Achieves Major Market Share Gains in 2004.

Terms of use | Copyright © 2012 Farlex, Inc. | Feedback | For webmasters | Submit articles