Printer Friendly
The Free Library
19,595,263 articles and books
Member login
User name  
Password 
 
Join us Forgot password?

American Physical Society Presents 2004 Joseph F. Keithley Award for Advances in Measurement Science.


Business Editors/High-Tech Writers

CLEVELAND--(BUSINESS WIRE)--June 8, 2004

Virgil Bruce Elings Recognized for

Development of Scanning Probe Microscopy microscopy /mi·cros·co·py/ (mi-kros´kah-pe) examination under or observation by means of the microscope.

mi·cros·co·py
n.
1. The study of microscopes.

2.
 

The American Physical Society The American Physical Society was founded in 1899 and is the world's second largest organization of physicists. The Society publishes more than a dozen science journals, including the world renowned Physical Review and Physical Review Letters, and organizes more than twenty science  (APS) named Virgil Bruce Elings of NanoDevices as the 2004 winner of the Joseph F. Keithley Award. The award was given for Elings's development of scanning probe microscopy through numerous inventions and improvements that led to its commercialization and for providing a role model of the physicist entrepreneur.

The Keithley Award, established in 1997, presents $5000 annually to a physicist who has been instrumental in the development of measurement techniques or equipment that have an impact on the physics community by providing better measurements. The award honors the late Joseph F. Keithley, Founder of Keithley Instruments Keithley Instruments (NYSE: KEI) is a measurement and instrument company headquartered in Solon, Ohio. Keithley develops, manufactures, markets and sells highly accurate instruments and data acquisition products, as well as complete system solutions for high-volume production , Inc. (NYSE NYSE

See: New York Stock Exchange
:KEI), for his contributions in the area of sensitive and precision instrument development and measurement techniques.

Elings studied mechanical engineering at Iowa State and earned his Ph.D. in Physics from the Massachusetts Institute of Technology Massachusetts Institute of Technology, at Cambridge; coeducational; chartered 1861, opened 1865 in Boston, moved 1916. It has long been recognized as an outstanding technological institute and its Sloan School of Management has notable programs in business,  (MIT MIT - Massachusetts Institute of Technology ). He taught Physics at the University of California, Santa Barbara History
The predecessor to UCSB, Santa Barbara State College, focused on teacher training, industrial arts, home economics, and foreign languages. Intense lobbying by an interest group in the City of Santa Barbara led by Thomas Storke and Pearl Chase persuaded the State
, for more than 20 years, most of the time in a Masters Degree program in Scientific Instrumentation, which he started in 1971. In 1987, Elings founded Digital Instruments, Inc., a leader in scanning probe microscope development and manufacturing, and served as its President and Chairman until his retirement in 1999. He holds 42 patents in Scanning Tunneling and Atomic Force Microscopes atomic force microscope (AFM), device that uses a spring-mounted probe to image individual atoms on the surface of a material. Unlike the scanning tunneling microscope, which is also a scanning probe microscope, the AFM can be used on materials that do not conduct .

About Keithley Instruments, Inc. With more than 50 years of measurement expertise, Keithley Instruments (www.keithley.com) has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency) geared to the specialized needs of electronics manufacturers for high performance production testing, process monitoring, product development, and research. By building upon our strength in electrical measurement solutions for research, Keithley has become a production test technology leader for the semiconductor, wireless, optoelectronics, and other precision electronics segments of the worldwide electronics industry. The value we provide to our customers is a combination of precision measurement technology and a rich understanding of their applications to improve the quality, throughput, and yield of their products.

Products and company names listed are trademarks or trade names of their respective companies.
COPYRIGHT 2004 Business Wire
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2004, Gale Group. All rights reserved. Gale Group is a Thomson Corporation Company.

 Reader Opinion

Title:

Comment:



 

Article Details
Printer friendly Cite/link Email Feedback
Publication:Business Wire
Geographic Code:1USA
Date:Jun 8, 2004
Words:363
Previous Article:Crossbeam Systems Announces Plans To Support Check Point InterSpect.
Next Article:Department of Human Services, State of Texas, Chooses Selfhelpworks, Inc., as Addition to Its Employee Wellness Program Benefits.
Topics:



Related Articles
Rubber Division presents awards.
Joseph F. Keithley Dies, Founded Keithley Instruments, Inc.
APS Names 2001 Joseph F. Keithley Award Winner.
Nominations Open for Joseph F. Keithley Award.
American Physical Society Presents Joseph F. Keithley Award for Advances in Measurement Science.
IEEE Presents 2004 Joseph F. Keithley Award for Outstanding Contributions in the Field of Electrical Measurement.
George R. Pilcher, of Akzo Nobel, to deliver 2004 Mattiello Memorial Lecture in Chicago.
Jonathan W. Martin of NIST to deliver 2006 FSCT Mattiello Memorial Lecture.
Jonathan W. Martin to receive 2006 Roy W. Tess Award.
Gordon P. Bierwagen, of NDSU, to deliver 2007 FSCT Mattiello Memorial Lecture.

Terms of use | Copyright © 2012 Farlex, Inc. | Feedback | For webmasters | Submit articles