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Agilent Technologies' Semiconductor Parametric Test System Fuels Transition to 300mm Wafers; Advanced Solution Accelerates Product Ramp, Improves Wafer Process Yield.


Business Editors/High Tech Writers

PALO ALTO Palo Alto, city, California
Palo Alto (păl`ō ăl`tō), city (1990 pop. 55,900), Santa Clara co., W Calif.; inc. 1894. Although primarily residential, Palo Alto has aerospace, electronics, and advanced research industries.
, Calif.--(BUSINESS WIRE)--July 10, 2000

Agilent Technologies This article needs sources or references that appear in reliable, third-party publications. Alone, primary sources and sources affiliated with the subject of this article are not sufficient for an accurate encyclopedia article.  Inc. (NYSE NYSE

See: New York Stock Exchange
:A) has introduced the Agilent 4073A Parametric Test System, featuring a newly developed Source Monitor Unit (SMU SMU Southern Methodist University
SMU Solid (Waste) Management Unit
SMU Saint Mary's University (Halifax, Nova Scotia; Philippines)
SMU Singapore Management University
SMU Saint Mary's University of Minnesota
) and matrix that enable accurate evaluation of ultra-low current and voltage on wafers. The 4073A provides advanced, high-performance testing capabilities to the fast-growing 300mm wafer-manufacturing community. An extension of the popular and reliable 4070 series, the 4073A is ideally suited for advanced laboratories and fabrication fabrication (fab´rikā´shn),
n the construction or making of a restoration.
 lines focusing on next-generation semiconductors.

Once thought incapable of testing ultra-low current and voltage, production parametric test systems have been limited by both their internal hardware and probe card A probe card is an interface between an electronic test system and a semiconductor wafer. Its purpose is to provide an electrical path between the test system and the circuits on the wafer, thereby permitting the testing and validation of the circuits at the wafer level, usually  performance. However, the 4073A Parametric Test System and probe card design not only precisely test ultra-low current and voltage, but also offer manufacturers critical ramp-up and process yield improvements thus enhancing overall time to market.

"Time-to-market pressures, especially those in the 300mm arena, are changing the landscape of parametric test," said John Scruggs, senior vice president and general manager of Agilent's Automated Test Group. "Consequently, we are seeing increasing demands on production equipment and parametric test."

New marketplace trends such as deep sub-micron and low-power consumption require ultra-low current (sub-100fA) and voltage (sub-uV) measurement capability for DRAM cell evaluation, Cu interconnect test, and analog device Analog device is apparatus that measures continuous information. The measured analog signal has an infinite number of possible values. The only limitation on resolution is the accuracy of the measuring device.  matching. Agilent, in conjunction with leading automatic wafer probe manufacturers, has developed a test system with an ultra-low noise floor, improved measurement precision and resolution, and fast low-current settling times The introduction to this article provides insufficient context for those unfamiliar with the subject matter.
Please help [ improve the introduction] to meet Wikipedia's layout standards. You can discuss the issue on the talk page.
 allowing for tightened measurement guardbands. These, in turn, lower the overall cost of test.

Current users of Agilent's popular 4071A and 4072A Parametric Test Systems will be able to upgrade their systems to the new 4073A, and current test plans will run on the 4073A with no modification. With its SECS/GEM interface link to all automation, Agilent's new parametric test system completely eliminates the need for test operators to handle wafers. Moreover, compatibility with the Agilent Semiconductor Process Evaluation Core Software (SPECS) test shell allows manufacturers to save time and money, especially as they migrate from 200mm to 300mm wafer fabrication Wafer Fabrication is a procedure composed of many repeated sequential processes to produce complete electrical or photonic circuits. Examples include production of radio frequency (RF) amplifiers, LEDs, optical computer components, and CPUs for computers.  lines.

U.S. Pricing and Availability

The Agilent 4073A Parametric Test System is expected to be available July 2000 with an expected ship date of November 2000. The system price is $340,000 including installation and training.

About Agilent Technologies

Agilent Technologies Inc. (NYSE: A) is a diversified technology company, resulting from Hewlett-Packard Company's plan to strategically realign re·a·lign  
tr.v. re·a·ligned, re·a·lign·ing, re·a·ligns
1. To put back into proper order or alignment.

2. To make new groupings of or working arrangements between.
 itself into two fully independent companies. With approximately 43,000 employees serving customers in more than 120 countries, Agilent Technologies is a global leader in designing and manufacturing test, measurement and monitoring instruments, systems and solutions, and semiconductor and optical components. The company serves markets that include communications, electronics, life sciences and healthcare. In fiscal year 1999, the businesses comprising Agilent, then a subsidiary of HP, had net revenue of more than $8.3 billion.

Information about Agilent Technologies can be found on the Web at www.agilent.com.

NOTE TO THE EDITOR: Sales information may be obtained by calling 1-800-452-4844. Please do NOT use the editor contact or corporate telephone numbers for sales information.

Information in this release applies specifically to products available in the United States United States, officially United States of America, republic (2005 est. pop. 295,734,000), 3,539,227 sq mi (9,166,598 sq km), North America. The United States is the world's third largest country in population and the fourth largest country in area. . Product availability and specifications may vary in non-U.S. markets.

If you choose to review these items, your readers will receive the quickest response to their inquiries by mailing them to Agilent Technologies, Test and Measurement Call Center, P.O. Box 4026, Englewood, CO, 80155-4026.
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No portion of this article can be reproduced without the express written permission from the copyright holder.
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Publication:Business Wire
Date:Jul 10, 2000
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