Printer Friendly
The Free Library
14,573,755 articles and books
Member login
User name  
Password 
 
Join us Forgot password?

Accuracy in Powder Diffraction III--Part 1: preface.


With the continuing advancements in the powder diffraction Powder diffraction is a scientific technique using X-Ray or neutron diffraction on powder or microcrystalline samples for structural characterization of materials.

Ideally, every possible crystalline orientation is represented equally in a powdered sample.
 technique, a broad-based review conference was warranted. Accordingly the IUCr Commission on Powder Diffraction, in conjunction with the National Institute of Standards and Technology National Institute of Standards and Technology, governmental agency within the U.S. Dept. of Commerce with the mission of "working with industry to develop and apply technology, measurements, and standards" in the national interest.  and the International Centre for Diffraction Data The International Centre for Diffraction Data (ICDD) maintains a database of powder diffraction patterns, the Powder Diffraction File (PDF), including the d-spacings (related to angle of diffraction) and relative intensities of observable diffraction peaks.  organized a third Accuracy in Powder Diffraction, APD-III, for April 22-25, 2001, following the successes of similar conferences held in 1979 and 1992. The proceedings of the conferences remain highly referenced to this day. For this reason, it was decided to publish within the Journal of Research of the National Institute of Standards and Technology.

The number of papers was too large to be published within a single issue of the Journal, so papers were divided, on a somewhat arbitrary basis, between the issue you are viewing, and a subsequent issue. Given the numerous new developments in powder diffraction methodology, the conference length was increased to four days, but still there was too little time for adequate oral presentation of many important topics, for example quantitative analysis Quantitative Analysis

A security analysis that uses financial information derived from company annual reports and income statements to evaluate an investment decision.

Notes:
. However, and extensive poster session A poster session is the juried presentation of research information by representatives of several research teams at a congress or conference with an academic or professional focus. These are particularly prominent at scientific conferences such as medical congresses.  was held and authors of posters were invited to submit extended abstracts, which will appear in the subsequent volume of these proceedings.

The conference was organized in five sessions: Instrumentation, Optics Characterization and Powder diffraction Techniques, Metrology, Structure Solution and Refinement, Phase Identification and Quantification, and Microstructure mi·cro·struc·ture  
n.
The structure of an organism or object as revealed through microscopic examination.


microstructure
Noun

a structure on a microscopic scale, such as that of a metal or a cell
, Lattice Defects and Residual Stress. In addition to a poster session, a 2 hour period was set aside for a "round table" discussion of issues pertaining accuracy and methodology in powder diffraction. This proved to be a most successful exchange, limited only by available time.

We, the organizers, enjoyed financial support from a range of organizations, both non-commercial and commercial, which was critical to success of this meeting. We also wish to thank the session organizers, all of those individuals who worked on the various committees, and Kathleen Kilmer and the staff of NIST (National Institute of Standards & Technology, Washington, DC, www.nist.gov) The standards-defining agency of the U.S. government, formerly the National Bureau of Standards. It is one of three agencies that fall under the Technology Administration (www.technology.  Conference Program whose hard work assured the success of this meeting.

James Cline

Special Issue Editor
COPYRIGHT 2004 National Institute of Standards and Technology
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2004, Gale Group. All rights reserved. Gale Group is a Thomson Corporation Company.

 Reader Opinion

Title:

Comment:



 

Article Details
Printer friendly Cite/link Email Feedback
Author:Cline, James
Publication:Journal of Research of the National Institute of Standards and Technology
Date:Jan 1, 2004
Words:328
Previous Article:NIST hosts rocket propellant RP-1 workshop.(General Developments)
Next Article:Fundamental parameters line profile fitting in laboratory diffractometers.
Topics:



Related Articles
Crystallographers at NBS/NIST.(National Bureau of Standards/National Institute of Standards and Technology)
High pressure x-ray crystallography with the diamond cell at NIST/NBS.(National Institute of Standards and Technology/National Bureau of Standards)
JCPDS-ICDD research Associateship (cooperative program with NBS/NIST).(Joint Committee on Powder Diffraction International Centre for Diffraction...
Fundamental parameters line profile fitting in laboratory diffractometers.
Direct space structure solution applications.
Diffraction line broadening analysis if broadening is caused by both dislocations and limited crystallite size.
Multidataset refinement resonant diffraction, and magnetic structures.
Powder diffraction: least-squares and beyond.
The high resolution powder diffraction beam line at ESRF.
Global Rietveld refinement.

Terms of use | Copyright © 2009 Farlex, Inc. | Feedback | For webmasters | Submit articles