ATE System.When used with a suitable test structure layout, the Model S400DC/RF DC/RF Direct Current / Radio Frequency ATE system can execute DC and RF tests independently and in parallel- reducing the cost of test on current advanced wafer processes. The system incorporates a vector network analyzer (VNA VNA abbr. Visiting Nurse Association ) and DC/RF probe card technology, supports "lights out" factory automation and is compatible with both 200- and 300-mm probers. Three system configurations are available for single DUT DUT Dutch (language) DUT Device Under Test DUT Diplôme Universitaire de Technologie (French University Graduation in Technology) DUT Dalian University of Technology (also seen as DLUT) testing up to 20 or 40 GHz. Keithley Instruments, Inc., Cleveland, OH Hall A1, Booth 119 Circle 118 http://www.circuitsassembly.com/ Copyright [copyright] 2001 CMP CMP (cytidine monophosphate): see cytosine. (1) (CMP Media LLC, Manhasset, NY, www.cmp.com) Part of United Business Media, CMP is a leading integrated media company that offers a wide variety of publications and services in the information Media LLC |
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