ASE Purchases Multiple NPTest EXA3000 Systems for PCI Express Production Test; EXA3000 Integrated System Improves Test Coverage at No Additional Cost.

Business Editors/High-Tech Writers

SAN JOSE, Calif.--(BUSINESS WIRE)--April 2, 2004

NPTest Holding Corporation (Nasdaq:NPTT), a leading supplier of test and diagnostic systems and engineering services to the semiconductor industry, announced today that ASE Test Limited (Nasdaq:ASTSF), the world's largest independent semiconductor test service provider, has purchased multiple EXA3000 systems configured for high volume manufacturing of ICs with PCI Express(TM). The EXA3000 system combines the high performance and accuracy needed to test high-speed buses, including PCI Express, with production-specific technology that provides superior test coverage at no additional cost.

PCI Express, one of the bus and interconnect architectures emerging to meet the demand for faster speeds and greater bandwidth, places extensive technical demands on automated test equipment. The EXA3000, known for its high performance, easily meets the PCI Express characterization requirements for increasing data rates -- up to 3.2 Gbps, low voltage differential signaling, multi-lane embedded clock signals and accurate jitter measurements. It also offers a distinct advantage for production test of PCI Express technology. Today's ICs feature shrinking process geometries, low power voltages and high frequencies that are introducing new fault effects. These are "soft defects," timing and signal integrity violations, which are increasing occurrences of transient and intermittent faults in production. Conventional production test strategies are not enough to catch these faults. Traditional, fast, low cost test that meets production throughput targets may lack realistic test coverage and lead to unacceptable level of system returns and poor DPM (defects per million) yields. The EXA3000 uses Far-End Loopback (FE-LB) methodology, native within the pin electronics. This eliminates load board-based implementations and reduces the number of relays in the measurement signal paths. Proven in high-speed communications test, the use of the Far-End Loopback technique is an elegantly simple way to identify the signal integrity-related faults prevalent in today's multi-gigabit devices.

"Offering our customers capacity on NPTest EXA3000 systems configured for production testing of PCI Express devices gives them and us a competitive edge," stated Raymond Lo, president of ASE Test Inc., in Taiwan. "The EXA3000 provides an ideal production test platform for ICs with high-speed buses. It offers a winning combination of high performance capabilities and improved test coverage of the defects likely to limit PCI Express yields. Importantly, NPTest uses a technique that is particularly valuable in the cost-conscious production environment."

"Makers of PCI Express devices, including chipsets and graphics processors, will find the optimal production test solution on the EXA3000 at ASE Test," stated Jean-Luc Pelissier, president of products, NPTest. "With the EXA3000, ASE Test will provide their customers a definite technology advantage that does not increase their test cost and economically scales as the PCI Express interface increases in lane size. The NPTest integrated test approach retains the ideal single point-to-point signal path between the DUT (device under test) and the ATE electronics; improving signal integrity, increasing test stability and maximizing production test yields."

EXA3000 systems configured for PCI Express production test will be installed at ASE Test's Kaohsiung, Taiwan facility.

About EXA3000

The EXA3000 semiconductor test system leads the industry in speed and accuracy, providing +/-50ps edge-placement accuracy, up to 3.2Gbps data rates, true differential pin electronics, multiple time domains, an integrated edge-aligned source synchronous timing solution, configuration flexibility up to 1280 pins and a -120dBc analog noise floor that results in the highest device output and yields on the most demanding devices. With full configuration flexibility on both digital and analog test resources, the EXA3000 system is designed to test a wide range of SOC devices that use the PCI-Express(TM) interface. Its easy-to-configure architecture and over 100-mixed signal test options make it an ideal candidate for test houses, contract manufacturers and integrated device manufacturers (IDM).

About ASE Test Limited

ASE Test Limited is the world's largest independent provider of semiconductor testing services. ASE Test provides customers with a complete range of semiconductor testing service, including front-end engineering testing, wafer probing, final production testing of packaged semiconductors and other test-related services. ASE Test has been quoted on Nasdaq since 1996 under the symbol "ASTSF".

ASE Test Limited is a member of the ASE Group, the world's largest provider of independent semiconductor manufacturing services in assembly and test. For more information, visit www.aseglobal.com.

About NPTest

NPTest designs, develops and manufactures advanced semiconductor test and diagnostic systems and provides related services for the semiconductor industry. NPTest customers include integrated device manufacturers, foundries, fabless companies and assembly and test subcontractors worldwide. NPTest products and services enable companies to bring their increasingly complex integrated circuits, or ICs, to market faster at lower cost and without compromising IC quality. The NPTest business traces its history back to 1965 when Fairchild Semiconductor established an automated test equipment division. NPTest is headquartered in San Jose, Calif., USA. Additional information is available at www.nptest.com.

NPTest is a trademark of NPTest. PCI Express is a trademark of the PCI Express SIG.