AIST Develops Nano-sized Particle Strength Measurement System.Tokyo, Japan, Oct 28, 2005 - (JCNN JCNN Japan Corporate News Network ) - The Integration Process Technology Group of the Advanced Manufacturing Research Institute, National Institute of Advanced Industrial Science and Technology The National Institute of Advanced Industrial Science and Technology (産業技術総合研究所 (AIST AIST Advanced Industrial Science and Technology (Japan) AIST National Institute of Advanced Industrial Science and Technology (Japan) AIST Association for Iron & Steel Technology ) has developed a system that can not only observe the deformation of each sub-micron (about 0.1 micron) particle under pressure, but also measure its compressive strength. In addition to an optical microscope, the system has an atomic force microscope atomic force microscope (AFM), device that uses a spring-mounted probe to image individual atoms on the surface of a material. Unlike the scanning tunneling microscope, which is also a scanning probe microscope, the AFM can be used on materials that do not conduct (ATM) equipped with a specially designed probe to measure particle shapes, and a diamond compression indentor whose tip is flattened using a focused ion beam Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor and materials science fields for site-specific analysis, deposition, and ablation of materials. The FIB is a scientific instrument that resembles a scanning electron microscope. (FIB) process to the extent that the tip is 1 micron in diameter, narrow enough to compress just a single particle at a time. The technology is expected to be used in the pharmaceutical and cosmetics industries that make use of ceramics technologies and fine particles. Details of the technology development will be presented at the MRS-Japan Academic Symposium to be held in Tokyo on December 10 and 11. Source: JCN http://www.japancorp.net Copyright [c] 2005 Japan Corporate News Network. All rights reserved. |
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