AFM imaging.This manufacturer of atomic force microscopes atomic force microscope (AFM), device that uses a spring-mounted probe to image individual atoms on the surface of a material. Unlike the scanning tunneling microscope, which is also a scanning probe microscope, the AFM can be used on materials that do not conduct has introduced the Orca module for conductive AFM (Atomic Force Microscope) A device used to image materials at the atomic level. AFMs are used to solve processing and materials problems in electronics, telecom, biology and other high-tech industries. measurements using the MFP-3D AFM System. Conductive AFM is said to be a powerful current-sensing technique for electrical characterization of conductivity variations in resistive resistive /re·sis·tive/ (re-zis´tiv) pertaining to or characterized by resistance. samples. Orca is said to be ideal for characterizing materials such as dielectric films, conductive polymers, etc. Asylum Research Circle 80 on card |
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