ADE Corporation to Present at Needham & Co. Growth Conference on January 7, 2004.Business Editors/High-Tech Writers WESTWOOD, Mass.--(BUSINESS WIRE)--Dec. 19, 2003 ADE Corporation (Nasdaq: ADEX ADEX Athens Derivatives Exchange (Athens, Greece) ADEX Air Defense Exercise ADEX Advertisement Expenditure ADEX Asociaciã³n de Exportadores (Peru) ), a leading supplier of production metrology metrology Science of measurement. Measuring a quantity means establishing its ratio to another fixed quantity of the same kind, known as the unit of that kind of quantity. and inspection systems for the semiconductor wafer (1) A small, thin continuous-loop magnetic tape cartridge that has been used from time to time for data storage and specialized applications. (2) The base unit of chip making. It is a slice taken from a salami-like silicon crystal ingot up to 12" (300mm) in diameter. , semiconductor device, magnetic storage and optics manufacturing industries manufacturing industries npl → industrias fpl manufactureras manufacturing industries npl → industries fpl de transformation , announced that it would be presenting at the upcoming conference.
Needham & Company Sixth Annual Growth Conference
Where: The New York Palace Hotel
455 Madison Avenue
New York, New York
Time: Wednesday, January 7, 2004 at 3:00 p.m. Eastern Time
About ADE Corporation ADE Corporation is a leading supplier of metrology and inspection systems required for production in the silicon wafer, semiconductor device, magnetic data storage and optics manufacturing industries. The Company's systems analyze and report product quality at critical manufacturing process steps for yield enhancement, providing quality certification data that is relied upon by semiconductor wafer, device and computer disk manufacturers. The Company's systems also are used for production measurements in the semiconductor chip fabrication fabrication (fab´rikā´sh n the construction or making of a restoration. process. To learn more about ADE, visit the Company's Web site at http://www.ade.com. |
|
||||||||||||||||

Printer friendly
Cite/link
Email
Feedback
Reader Opinion