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A fixture for characterizing underfill: this inexpensive and adaptable non-proprietary hardware aids visibility.


Underfill can improve the reliability of BGAs during exposure to thermal cycle or vibration. The development of the best material and processing is often hampered by visibility: you cannot see what you are doing. Flow fronts, voids, mixing, coverage and uniformity typically cannot be characterized without destroying expensive hardware. This fixture might help: a simple slab of aluminum, a slot to contain a little pane of tempered glass, ringed by De-Sta-Co or other adjustable clamps (Figures 1 and 2).

To use it: Set the BGA (Ball Grid Array) A popular surface mount chip package that uses a grid of solder balls as its connectors. Available in plastic and ceramic varieties, BGA is noted for its compact size, high lead count and low inductance, which allows lower voltages to be used. , adjust the clamp height and pressure just enough to hold the BGA in place, dispense the underfill material, cure (if necessary or if part of a study), unclamp the glass and view the underside. Clean and try another variant.

Studies could include characterization of flow behaviors: temperature vs. viscosity; perimeter-fill processing; flow-around a center heat slug (hardware, processor) heat slug - A metal plate that helps dissipate heat away from the silicon core of a processor to the packaging or heat-sink.  or adhesive dots; damming, mixing and sequencing, etc; or they could involve processing details: dispense nozzles and pressures; access, interference and traverse patterns; studies of damage to columns; remove and repair-replace processes; displacement of the part or spacers due to side filling, etc.

Other studies could concentrate on materials properties This is a list of materials properties. A materials property is an intensive, often quantitative property of a material, usually with a unit that may be used as a metric of value to compare the benefits of one material versus another to aid in materials selection.  and effects: location and extent of voids before and after cure; CTE (Coefficient of Thermal Expansion) The difference between the way two materials expand when heat is applied. This is very critical when chips are mounted to printed circuit boards, because the silicon chip expands at a different rate than the plastic board.  deformation; z-axis geometry effect of cure frothing froth  
n.
1. A mass of bubbles in or on a liquid; foam.

2. Salivary foam released as a result of disease or exhaustion.

3. Something unsubstantial or trivial.

4.
 and voids; degassing degassing
(dēgas´ing),
adj related to degasification, the process by which dissolved gas is removed from water or other liquid solutions.
 effects; chemical compatibility; effect of simulated PWB (Printed Wiring Board) An alternate term for printed circuit board. See printed circuit board.  surface roughness on flow, etc. Or they might cover other special objectives: component keep-outs and adjacent-part interference; investigation of special rework/removal issues; simulations of varying collapse geometries due to different levels of temperature/ time/weight, as that affects underfill flow, etc.

[FIGURE 1 OMITTED]

[FIGURE 2 OMITTED]

[FIGURE 3 OMITTED]

[FIGURE 4 OMITTED]

These special objectives go beyond the usual demonstration of viscosity, gap, extent and fill location, and could also benefit from adaptations of this simple glass-slide fixturing approach. A possible side benefit: simple show-and-tell visuals based on glass specimens from this fixture could be used to illustrate development issues and status.

The design is not critical, and the value is in ease-of-use and the visualization capability. The fixture shown is for maximum adaptability. Alternate designs could be tailored for small-size (first-level flip-chip, inside-the-package technologies) or high-temperature clamps for cure studies; designs with adjustable side x, y or z features to study dispense-access or removal constraints; calibrated cal·i·brate  
tr.v. cal·i·brat·ed, cal·i·brat·ing, cal·i·brates
1. To check, adjust, or determine by comparison with a standard (the graduations of a quantitative measuring instrument):
 vertical stops and loading to study z-axis CTE effects. For simple tasks, the clamps need not be articulated: simple bucktooth buck·tooth
n.
A prominent, projecting upper front tooth.



bucktoothed
 cleats, with finger-tightened knurled- nuts similar to those shown Figure 2, could offer clearance and size options to suit the task.

[FIGURE 5 OMITTED]

[FIGURE 6 OMITTED]

[FIGURE 7 OMITTED]

[FIGURE 8 OMITTED]

Figure 3 shows the results of a study on several types of BGAs (a large ceramic column grid array, PBGAs, a medium-sized CBGA CBGA Ceramic Ball Grid Array
CBGA Central Banks Gold Agreement
CBGA Cascade Boer Goat Association
 and [U]BGAs) in an exploratory dispense test of a candidate underfill formulation. The closeup (Figure 4) of underfill on a PBGA PBGA Plastic Ball Grid Array  shows clearly unacceptable results but illustrate the visualization and characterization capability. These typical bottom-side seen-through-the-glass images demonstrate the ready visibility of the extent and characteristics of the flow. Certainly, the development engineer's tasks, process controls and results would be much more precise, discriminating and relevant, embodying precise dimensional and photo documentation.

Figures 5 to 8 show more dramatic examples, for demonstration purposes only, of the underfill processing characteristics that can readily seen and documented by using the bottom-side see-through capabilities enabled by this fixture.

This fixture concept is not new, and certainly is not revolutionary, but is offered to possibly benefit industry development of underfill materials and processes.

Acknowledgments

Appreciation is extended to the Sunnyvale SMT (1) (Surface Mount Technology) See surface mount.

(2) (Station ManagemenT) An FDDI network management protocol that provides direct management. Only one node requires the software.

SMT - Station Management
 manufacturing and materials & process engineers for their support and utilization of this project.

Tom Clifford is group lead, advanced electronics packaging, Lockheed Martin (lmco.com); tom.clifford@lmco.com.
COPYRIGHT 2006 UP Media Group, Inc.
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2006, Gale Group. All rights reserved. Gale Group is a Thomson Corporation Company.

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Title Annotation:Underfill Characterization
Author:Clifford, Tom
Publication:Circuits Assembly
Date:May 1, 2006
Words:622
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